Simulation-based Fault Injection in VHDL descriptions is increasingly common due to the popularity of top-down design flows exploiting this language. This paper presents some techniques for reducing the time to perform the required simulation experiments. Static and dynamic methods are proposed to analyze the list of faults to be injected, removing faults as soon as their behavior is known. Common features available in most VHDL simulation environments are also exploited. Experimental results show that the proposed techniques are able to reduce the time required by a typical Fault Injection campaign by a factor ranging from 43.9% to 96.6%
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
Testability analysis of VHDL sequential models is the main topic of this paper. We investigate the p...
Investigates an approach allowing one to evaluate the consequences of single event upset phenomena f...
A technique is described for the automatic insertion of fault models into VHDL gate models, using sh...
The early assessment of the fault tolerance mechanisms is an essential task in the design of dependa...
This paper presents a technique for reducing CPU time to perform simulation-based fault-injection ex...
This paper proposes a high level technique to inject transient faults in processor-like circuits, an...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174The probability of transi...
ISBN: 0769507190Analyzing at an early stage of the design the potential faulty behaviors of a circui...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
International audienceThe probability of transient faults increases with the evolution of technologi...
This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perfor...
International audienceThe tools that are used to inject faults in FPGA based implementations are gen...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
Testability analysis of VHDL sequential models is the main topic of this paper. We investigate the p...
Investigates an approach allowing one to evaluate the consequences of single event upset phenomena f...
A technique is described for the automatic insertion of fault models into VHDL gate models, using sh...
The early assessment of the fault tolerance mechanisms is an essential task in the design of dependa...
This paper presents a technique for reducing CPU time to perform simulation-based fault-injection ex...
This paper proposes a high level technique to inject transient faults in processor-like circuits, an...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174The probability of transi...
ISBN: 0769507190Analyzing at an early stage of the design the potential faulty behaviors of a circui...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
International audienceThe probability of transient faults increases with the evolution of technologi...
This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perfor...
International audienceThe tools that are used to inject faults in FPGA based implementations are gen...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
Testability analysis of VHDL sequential models is the main topic of this paper. We investigate the p...
Investigates an approach allowing one to evaluate the consequences of single event upset phenomena f...