This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology. The proposed method gets an executable UML (Unified Modeling Language) model of the SoC and the raw soft- error rate of different parts of the platform as its inputs. Soft-errors on the design are modeled by disturbances on the value of attributes in the classes of the UML model and disturbances on opcodes of software cores. The Dynamic behavior of each core is used to determine the propagation probability of each variable disturbance to the core outputs. Furthermore, the SER and the execution time of each core in the SoC and a Failure Modes and Effects Analysis (FMEA) that determines ...
textTraditional solutions for test and reliability do not scale well for modern designs with their s...
This article re-examines the soft error effect caused by radiation-induced particles beyond the deep...
International audienceAs process technology downscales, testing difficulties and susceptibility of c...
This paper proposes an analytical method to assess softerror rate (SER) in the early stages of a Sys...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
The development of process technology has increased system performance, but the system failure proba...
Minimizing the risk of system failure in any computer structure requires identifying those component...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
SUMMARY This paper proposes a soft-error model for accurately esti-mating reliability of a computer ...
What is the probability that the execution state of a given microprocessor running a given applicati...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
textTraditional solutions for test and reliability do not scale well for modern designs with their s...
This article re-examines the soft error effect caused by radiation-induced particles beyond the deep...
International audienceAs process technology downscales, testing difficulties and susceptibility of c...
This paper proposes an analytical method to assess softerror rate (SER) in the early stages of a Sys...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
The development of process technology has increased system performance, but the system failure proba...
Minimizing the risk of system failure in any computer structure requires identifying those component...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
SUMMARY This paper proposes a soft-error model for accurately esti-mating reliability of a computer ...
What is the probability that the execution state of a given microprocessor running a given applicati...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
textTraditional solutions for test and reliability do not scale well for modern designs with their s...
This article re-examines the soft error effect caused by radiation-induced particles beyond the deep...
International audienceAs process technology downscales, testing difficulties and susceptibility of c...