This paper presents a High-Level EDA environment based on the Hierarchical Distributed BIST (HD-BIST), a flexible and reusable approach to solve BIST scheduling issues in System-on-Chip applications. HD-BIST allows activating and controlling different BISTed blocks at different levels of hierarchy, with a minimum overhead in terms of area and test time. Besides the hardware layer, the authors present the HD-BIST application layer, where a simple modeling language, and a prototypical EDA tool demonstrate the effectiveness of the automation of the HD-BIST insertion in the test strategy definition of a complex System-on-Chip
Digital circuit testing is presented in this thesis. This thesis introduces an architecture that acc...
[[abstract]]A built-in self-test (BIST) compiler for embedded memories, called BRAINS (Bist for RAm ...
[[abstract]]Memory testing is becoming the dominant factor in testing a system-on-chip (SOC), with t...
Proposes HD2BIST, a complete hierarchical framework for BIST scheduling, data patterns delivering, a...
This paper presents the integration of a proprietary hierarchical and distributed test access mechan...
HD2BIST - a complete hierarchical framework for BIST scheduling, data-patterns delivery, and diagnos...
This paper presents a BIST architecture, based on a single microprogrammable BIST processor and a se...
The present paper proposes a solution to the problem of testing a system containing many distributed...
Multiport memories are widely used as embedded cores in all communication system-on-chip devices. Du...
Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments c...
The progress in the fields of miniaturisation (surface mount technology, large pin count ICs, etc.) ...
[[abstract]]© 1999 Institute of Electrical and Electronics Engineers - The programmable BIST design ...
The technological development is enabling the production of increasingly complex electronic systems....
New and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data...
Abstract—Built-in self-test (BIST) is a well-known design technique in which part of a circuit is us...
Digital circuit testing is presented in this thesis. This thesis introduces an architecture that acc...
[[abstract]]A built-in self-test (BIST) compiler for embedded memories, called BRAINS (Bist for RAm ...
[[abstract]]Memory testing is becoming the dominant factor in testing a system-on-chip (SOC), with t...
Proposes HD2BIST, a complete hierarchical framework for BIST scheduling, data patterns delivering, a...
This paper presents the integration of a proprietary hierarchical and distributed test access mechan...
HD2BIST - a complete hierarchical framework for BIST scheduling, data-patterns delivery, and diagnos...
This paper presents a BIST architecture, based on a single microprogrammable BIST processor and a se...
The present paper proposes a solution to the problem of testing a system containing many distributed...
Multiport memories are widely used as embedded cores in all communication system-on-chip devices. Du...
Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments c...
The progress in the fields of miniaturisation (surface mount technology, large pin count ICs, etc.) ...
[[abstract]]© 1999 Institute of Electrical and Electronics Engineers - The programmable BIST design ...
The technological development is enabling the production of increasingly complex electronic systems....
New and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data...
Abstract—Built-in self-test (BIST) is a well-known design technique in which part of a circuit is us...
Digital circuit testing is presented in this thesis. This thesis introduces an architecture that acc...
[[abstract]]A built-in self-test (BIST) compiler for embedded memories, called BRAINS (Bist for RAm ...
[[abstract]]Memory testing is becoming the dominant factor in testing a system-on-chip (SOC), with t...