A new SEM-based in-line electron holography microscope has been under development. The microscope utilizes conventional SEM and BF-STEM functionality to allow for rapid searching of the specimen of interest, seamless interchange between SEM, BF-STEM and holographic imaging modes, and makes use of coherent low-energy in-line electron holography to obtain low-dose, high-contrast images of light element materials. We report here an overview of the instrumentation and first experimental results on gold nano-particles and carbon nano-fibers for system performance tests. Reconstructed images obtained from the holographic imaging mode of the new microscope show substantial image contrast and resolution compared to those acquired by SEM and BF-STEM...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
The main aspects of the SEM performed in the low energy (below 5 keV) and very low energy (below 50 ...
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...
We describe a new type of scanning electron microscope which works by directly imaging the electron ...
Small particles (Cu, Ag, In, Sn, Au, also MgO and NaCl) were prepared in the diameter range from 1 n...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
Motivated by the need for less destructive imaging of nanostructures, we pursue point-source in-line...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
High resolution and high quality secondary electron (SE) images can be obtained in a dedicated scann...
Atomic resolution imaging of light elements in electron-transparent materials has long been a challe...
The low energy scanning electron microscope (SEM) which is currently at the Institute of\nScientific...
We describe a type of scanning electron microscope that works by directly imaging the electron field...
One of the major improvements in transmission electron microscopy over the last years is the additio...
An ultra high resolution scanning electron microscope, which is composed of a cold cathode field emi...
Electrons with an energy ranging from 0 to 50 keV are among the most versatile tools in nanotechnolo...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
The main aspects of the SEM performed in the low energy (below 5 keV) and very low energy (below 50 ...
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...
We describe a new type of scanning electron microscope which works by directly imaging the electron ...
Small particles (Cu, Ag, In, Sn, Au, also MgO and NaCl) were prepared in the diameter range from 1 n...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
Motivated by the need for less destructive imaging of nanostructures, we pursue point-source in-line...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
High resolution and high quality secondary electron (SE) images can be obtained in a dedicated scann...
Atomic resolution imaging of light elements in electron-transparent materials has long been a challe...
The low energy scanning electron microscope (SEM) which is currently at the Institute of\nScientific...
We describe a type of scanning electron microscope that works by directly imaging the electron field...
One of the major improvements in transmission electron microscopy over the last years is the additio...
An ultra high resolution scanning electron microscope, which is composed of a cold cathode field emi...
Electrons with an energy ranging from 0 to 50 keV are among the most versatile tools in nanotechnolo...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
The main aspects of the SEM performed in the low energy (below 5 keV) and very low energy (below 50 ...
The scanning electron microscope (SEM) usually operates with a beam voltage, V0, in the range of 10-...