SI 1 J 125 Sample map

Analysis code and raw data for 'Automatic Etch Pit Density Analysis in Multicrystalline Silicon'

Fleck, M (via Mendeley Data)

July 2020

"etch_pit_density_analysis.zip" contains the analysis code. See the README.txt for more information....

IODP Expedition 396 Scanning electron microscope images

Planke, Sverre
Berndt, Christian
Alvarez Zarikian, Carlos A.
Agarwal, Amar
Andrews, Graham D.M.
Betlem, Peter
Bhattacharya, Joyeeta
Brinkhuis, Henk
Chatterjee, Sayantani
Christopoulou, Marialena
Clementi, Vincent J.
Ferré, Eric C.
Filina, Irina Y.
Frieling, Joost
Guo, Pengyuan
Harper, Dustin T.
Jones, Morgan T.
Lambart, Sarah
Longman, Jack
Millett, John
Mohn, Geoffroy
Nakaoka, Reina
Scherer, Reed P.
Tegner, Christian
Varela, Natalia
Wang, Mengyuan
Xu, Weimu
Yager, Stacy L.

April 2023

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Draft INFL Guideline on SIMS

Kristo, M J

April 2012

Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples....

SI 5 J 273 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-273 sample surface with reflected light and scanning electron microscopy image...

SI 2 J 145 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-145 sample surface with reflected light and scanning electron microscopy image...

SI 4 J 215 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-215 sample surface with reflected light and scanning electron microscopy image...

SI 3 J 209 Sample map

Benjamin Linzmeier (5188946)
Neil Landman (3197694)
Shanan Peters (3396632)
Reinhard Kozdon (497828)
Kouki Kitajima (5188949)
John Valley (5188943)

May 2018

Flat summary map of J-209 sample surface with reflected light and scanning electron microscopy image...

Preparation of sample cross-sections and analysis by SIMS

Karlovský, Juraj

January 2018

This thesis studies possible methods of semiconductor sample measurement by SIMS, with emphasis on t...

IODP Expedition 350 Scanning electron microscope images

Tamura, Yoshihiko
Busby, Cathy J.
Blum, Peter
Guèrin, Gilles
Andrews, Graham D.M.
Barker, Abigail K.
Berger, Julien L.R.
Bongiolo, Everton M.
Bordiga, Manuela
DeBari, Susan M.
Gill, James B.
Hamelin, Cedric
Jia, Jihui
John, Eleanor H.
Jonas, Ann Sophie
Jutzeler, Martin
Kars, Myriam A.C.
Kita, Zachary A.
Konrad, Kevin
Mahony, Susan H.
Martini, Michelangelo
Miyazaki, Takashi
Musgrave, Robert J.
Nascimento, Debora B.
Nichols, Alexander R.L.
Ribeiro, Julia M.
Sato, Tomoki
Schindlbeck, Julie C.
Schmitt, Axel K.
Straub, Susanne M.
Vautravers, Maryline J.
Yang, Alexandra Yang

May 2015

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Map of artefacts distribution on surface at JQ-101, with trenches localisation.

Rémy Crassard (118552)
Michael D. Petraglia (118545)
Adrian G. Parker (118559)
Ash Parton (118560)
Richard G. Roberts (118561)
Zenobia Jacobs (435157)
Abdullah Alsharekh (118547)
Abdulaziz Al-Omari (5655760)
Paul Breeze (118550)
Nick A. Drake (118553)
Huw S. Groucutt (118555)
Richard Jennings (118557)
Emmanuelle Régagnon (435158)
Ceri Shipton (118563)

July 2013

<p>Map of artefacts distribution on surface at JQ-101, with trenches localisation.</p

1.4 For the sample site, document the texture to sub-cm resolution and the morphology, geochemistry, and spectral properties sufficiently to select the site and provide context for the sample. ‘Resolution’ is defined as the root-mean-square spot size characterizing the sub-cm imager

OSIRIS-REx Asteroid Sample Return Mission

January 2012

Documents relating to the 1.4 – For the sample site, document the texture to sub-cm resolution and t...

SIMS instrumentation and methodology for mapping of co-localized molecules

J. Eller, M.
V. Verkhoturov, S.
Della-Negra, S.
A. Schweikert, E.

January 2013

We describe an innovative mode for localizing surface molecules. In this methodology, individual C60...

IODP Expedition 392 Scanning electron microscope images

Uenzelmann-Neben, Gabriele
Bohaty, Steven M.
Childress, Laurel B.
Archontikis, Odysseas A.
Batenburg, Sietske J.
Bijl, Peter K.
Burkett, Ashley M.
Cawthra, Hayley C.
Chanda, Pratyusha
Coenen, Jason J.
Dallanave, Edoardo
Davidson, Peter C.
Doiron, Kelsey E.
Geldmacher, Jörg
Gürer, Derya
Haynes, Shannon J.
Herrle, Jens O.
Ichiyama, Yuji
Jana, Debadrita
Jones, Matthew M.
Kato, Chie
Kulhanek, Denise K.
Li, Juan
Liu, Jia
McManus, James
Minakov, Alexander N.
Penman, Donald E.
Sprain, Courtney J.
Tessin, Allyson C.
Wagner, Thomas
Westerhold, Thomas

August 2023

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Carbonne, Johanna Marin
Kiss, Andras
Bouvier, Anne-Sophie
Meibom, Anders
Baumgartner, Lukas
Bovay, Thomas
Plane, Florent
Escrig, Stephane
Rubatto, Daniela

April 2022

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...

IODP Expedition 351 Scanning electron microscope images

Arculus, Richard
Ishizuka, Osamu
Bogus, Kara A.
Aljahdali, Mohammed H.
Bandini-Maeder, Alexandre N.
Barth, Andrew P.
Brandl, Phillipp A.
do Monte Guerra, Rodrigo
Drab, Laureen
Gurnis, Michael C.
Hamada, Morihisa
Hickey-Vargas, Rosemary L.
Jiang, Fuqing
Kanayama, Kyoko
Kender, Sev
Kusano, Yuki
Li, He
Loudin, Lorne C.
Maffione, Marco
Marsaglia, Kathleen M.
McCarthy, Anders J.
Meffre, Sebastien
Morris, Antony
Savov, Ivan P.
Sena Da Silva, Clara A.
Tepley, Frank J. III
van der Land, Cees
Yogodzinski, Gene M.
Zhang, Zhaohui

August 2015

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Analysis code and raw data for 'Automatic Etch Pit Density Analysis in Multicrystalline Silicon'

Fleck, M (via Mendeley Data)

July 2020

"etch_pit_density_analysis.zip" contains the analysis code. See the README.txt for more information....

IODP Expedition 396 Scanning electron microscope images

Planke, Sverre
Berndt, Christian
Alvarez Zarikian, Carlos A.
Agarwal, Amar
Andrews, Graham D.M.
Betlem, Peter
Bhattacharya, Joyeeta
Brinkhuis, Henk
Chatterjee, Sayantani
Christopoulou, Marialena
Clementi, Vincent J.
Ferré, Eric C.
Filina, Irina Y.
Frieling, Joost
Guo, Pengyuan
Harper, Dustin T.
Jones, Morgan T.
Lambart, Sarah
Longman, Jack
Millett, John
Mohn, Geoffroy
Nakaoka, Reina
Scherer, Reed P.
Tegner, Christian
Varela, Natalia
Wang, Mengyuan
Xu, Weimu
Yager, Stacy L.

April 2023

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Draft INFL Guideline on SIMS

Kristo, M J

April 2012

Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples....

SI 5 J 273 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-273 sample surface with reflected light and scanning electron microscopy image...

SI 2 J 145 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-145 sample surface with reflected light and scanning electron microscopy image...

SI 4 J 215 Sample map

Linzmeier, Benjamin
Landman, Neil
Peters, Shanan
Kozdon, Reinhard
Kitajima, Kouki
Valley, John

May 2018

Flat summary map of J-215 sample surface with reflected light and scanning electron microscopy image...

SI 3 J 209 Sample map

Benjamin Linzmeier (5188946)
Neil Landman (3197694)
Shanan Peters (3396632)
Reinhard Kozdon (497828)
Kouki Kitajima (5188949)
John Valley (5188943)

May 2018

Flat summary map of J-209 sample surface with reflected light and scanning electron microscopy image...

Preparation of sample cross-sections and analysis by SIMS

Karlovský, Juraj

January 2018

This thesis studies possible methods of semiconductor sample measurement by SIMS, with emphasis on t...

IODP Expedition 350 Scanning electron microscope images

Tamura, Yoshihiko
Busby, Cathy J.
Blum, Peter
Guèrin, Gilles
Andrews, Graham D.M.
Barker, Abigail K.
Berger, Julien L.R.
Bongiolo, Everton M.
Bordiga, Manuela
DeBari, Susan M.
Gill, James B.
Hamelin, Cedric
Jia, Jihui
John, Eleanor H.
Jonas, Ann Sophie
Jutzeler, Martin
Kars, Myriam A.C.
Kita, Zachary A.
Konrad, Kevin
Mahony, Susan H.
Martini, Michelangelo
Miyazaki, Takashi
Musgrave, Robert J.
Nascimento, Debora B.
Nichols, Alexander R.L.
Ribeiro, Julia M.
Sato, Tomoki
Schindlbeck, Julie C.
Schmitt, Axel K.
Straub, Susanne M.
Vautravers, Maryline J.
Yang, Alexandra Yang

May 2015

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Map of artefacts distribution on surface at JQ-101, with trenches localisation.

Rémy Crassard (118552)
Michael D. Petraglia (118545)
Adrian G. Parker (118559)
Ash Parton (118560)
Richard G. Roberts (118561)
Zenobia Jacobs (435157)
Abdullah Alsharekh (118547)
Abdulaziz Al-Omari (5655760)
Paul Breeze (118550)
Nick A. Drake (118553)
Huw S. Groucutt (118555)
Richard Jennings (118557)
Emmanuelle Régagnon (435158)
Ceri Shipton (118563)

July 2013

<p>Map of artefacts distribution on surface at JQ-101, with trenches localisation.</p

1.4 For the sample site, document the texture to sub-cm resolution and the morphology, geochemistry, and spectral properties sufficiently to select the site and provide context for the sample. ‘Resolution’ is defined as the root-mean-square spot size characterizing the sub-cm imager

OSIRIS-REx Asteroid Sample Return Mission

January 2012

Documents relating to the 1.4 – For the sample site, document the texture to sub-cm resolution and t...

SIMS instrumentation and methodology for mapping of co-localized molecules

J. Eller, M.
V. Verkhoturov, S.
Della-Negra, S.
A. Schweikert, E.

January 2013

We describe an innovative mode for localizing surface molecules. In this methodology, individual C60...

IODP Expedition 392 Scanning electron microscope images

Uenzelmann-Neben, Gabriele
Bohaty, Steven M.
Childress, Laurel B.
Archontikis, Odysseas A.
Batenburg, Sietske J.
Bijl, Peter K.
Burkett, Ashley M.
Cawthra, Hayley C.
Chanda, Pratyusha
Coenen, Jason J.
Dallanave, Edoardo
Davidson, Peter C.
Doiron, Kelsey E.
Geldmacher, Jörg
Gürer, Derya
Haynes, Shannon J.
Herrle, Jens O.
Ichiyama, Yuji
Jana, Debadrita
Jones, Matthew M.
Kato, Chie
Kulhanek, Denise K.
Li, Juan
Liu, Jia
McManus, James
Minakov, Alexander N.
Penman, Donald E.
Sprain, Courtney J.
Tessin, Allyson C.
Wagner, Thomas
Westerhold, Thomas

August 2023

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Carbonne, Johanna Marin
Kiss, Andras
Bouvier, Anne-Sophie
Meibom, Anders
Baumgartner, Lukas
Bovay, Thomas
Plane, Florent
Escrig, Stephane
Rubatto, Daniela

April 2022

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...

IODP Expedition 351 Scanning electron microscope images

Arculus, Richard
Ishizuka, Osamu
Bogus, Kara A.
Aljahdali, Mohammed H.
Bandini-Maeder, Alexandre N.
Barth, Andrew P.
Brandl, Phillipp A.
do Monte Guerra, Rodrigo
Drab, Laureen
Gurnis, Michael C.
Hamada, Morihisa
Hickey-Vargas, Rosemary L.
Jiang, Fuqing
Kanayama, Kyoko
Kender, Sev
Kusano, Yuki
Li, He
Loudin, Lorne C.
Maffione, Marco
Marsaglia, Kathleen M.
McCarthy, Anders J.
Meffre, Sebastien
Morris, Antony
Savov, Ivan P.
Sena Da Silva, Clara A.
Tepley, Frank J. III
van der Land, Cees
Yogodzinski, Gene M.
Zhang, Zhaohui

August 2015

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Analysis code and raw data for 'Automatic Etch Pit Density Analysis in Multicrystalline Silicon'

Fleck, M (via Mendeley Data)

July 2020

"etch_pit_density_analysis.zip" contains the analysis code. See the README.txt for more information....

IODP Expedition 396 Scanning electron microscope images

Planke, Sverre
Berndt, Christian
Alvarez Zarikian, Carlos A.
Agarwal, Amar
Andrews, Graham D.M.
Betlem, Peter
Bhattacharya, Joyeeta
Brinkhuis, Henk
Chatterjee, Sayantani
Christopoulou, Marialena
Clementi, Vincent J.
Ferré, Eric C.
Filina, Irina Y.
Frieling, Joost
Guo, Pengyuan
Harper, Dustin T.
Jones, Morgan T.
Lambart, Sarah
Longman, Jack
Millett, John
Mohn, Geoffroy
Nakaoka, Reina
Scherer, Reed P.
Tegner, Christian
Varela, Natalia
Wang, Mengyuan
Xu, Weimu
Yager, Stacy L.

April 2023

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and ...

Draft INFL Guideline on SIMS

Kristo, M J

April 2012

Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples....

SI 1 J 125 Sample map

Abstract

Extracted data

SI 1 J 125 Sample map

Abstract

Extracted data

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