Development And Electrical Characterization Of An Ion Implanted Metal/Polymer Mix

Ion implantation has been shown to enhance the surface electrical conductivity of originally insulating polymers. The scope of this investigation was to add one more component to the system before implantation. The component added was a metal. The addition of a metal to the system should enhance the electrical properties by adding excess carriers to the band structure. A range of samples was prepared using thermal evaporation and ion implantation. The samples consist of the polymer, PEEK (poly-ether-ether-ketone) and the metal, tellurium. Electrical characterization was preformed on the new semiconductor material formed by ion beam mixing. Electrical properties such as the temperature coefficient of resistance and resistivity were investigated. The material was also tested for its electrical response to infrared radiation by measuring the voltage responsivity