High-frequency capacitance-voltage (C-V) characteristics of a buried-channel, MOS capacitor have been analyzed. High-frequency capacitance of a buried-channel MOS capacitor that has a player at the surface of n substrate reaches a minimum value and then slightly increases to saturate in the inversion region. Poisson equation is solved numerically including hole redistribution effect by the gate-voltage change for the measurement signal. The result quantitatively explains the existence of capacitance minimum which is peculiar to a buried-channel MOS capacitor
A detailed analysis of the strong inversion high frequency, capacitance under the Fowler-Nordheim (F...
Degradation of the gate oxide is often studied by stressing of metal-oxide-semiconductor (MOS) capac...
Abstract: The aim of this paper is to calculate the MOSFET parasitic capacitances, and then based on...
High-frequency capacitance-voltage (C-V) characteristics of a buried-channel MOS capacitor have been...
Capacitance-voltage (C-V) characteristics of buried-channel MOS capacitors have been studied by smal...
With the employment of ultrathin, high dielectric constant gate materials in advanced semiconductor ...
In this work, we describe how the frequency dependence of conductance (G) and capacitance (C) of a g...
Experimental observations for the In 0.53 Ga 0.47 As metal-oxide-semiconductor (MOS) system in inver...
This thesis submitted in partial fulfillment of the requirements for the degree of B.Sc in Electrica...
The exploration and modeling of high-frequency MOSFET phenomena are vitally important because MOSFET...
We present a MOS capacitance-voltage measurement methodology that, contrary to present methods, is h...
We present a MOS Capacitance-Voltage measurement methodology that, contrary to present methods, is h...
Abstract—An improved two-frequency method of capacitance measurement for the high-k gate dielectrics...
Capacitance-voltage (C-V) gate characteristics of power metal-oxide-semiconductor field-effect trans...
This paper presents a detailed investigation of the temperature dependence of frequency dispersion o...
A detailed analysis of the strong inversion high frequency, capacitance under the Fowler-Nordheim (F...
Degradation of the gate oxide is often studied by stressing of metal-oxide-semiconductor (MOS) capac...
Abstract: The aim of this paper is to calculate the MOSFET parasitic capacitances, and then based on...
High-frequency capacitance-voltage (C-V) characteristics of a buried-channel MOS capacitor have been...
Capacitance-voltage (C-V) characteristics of buried-channel MOS capacitors have been studied by smal...
With the employment of ultrathin, high dielectric constant gate materials in advanced semiconductor ...
In this work, we describe how the frequency dependence of conductance (G) and capacitance (C) of a g...
Experimental observations for the In 0.53 Ga 0.47 As metal-oxide-semiconductor (MOS) system in inver...
This thesis submitted in partial fulfillment of the requirements for the degree of B.Sc in Electrica...
The exploration and modeling of high-frequency MOSFET phenomena are vitally important because MOSFET...
We present a MOS capacitance-voltage measurement methodology that, contrary to present methods, is h...
We present a MOS Capacitance-Voltage measurement methodology that, contrary to present methods, is h...
Abstract—An improved two-frequency method of capacitance measurement for the high-k gate dielectrics...
Capacitance-voltage (C-V) gate characteristics of power metal-oxide-semiconductor field-effect trans...
This paper presents a detailed investigation of the temperature dependence of frequency dispersion o...
A detailed analysis of the strong inversion high frequency, capacitance under the Fowler-Nordheim (F...
Degradation of the gate oxide is often studied by stressing of metal-oxide-semiconductor (MOS) capac...
Abstract: The aim of this paper is to calculate the MOSFET parasitic capacitances, and then based on...