Effect of electric current annealing in phase transition of Mn-Al alloy

The electronic structure of any material can be modified when it is exposed to high density electric currents or high strength electric fields, caused by the increased electronic/ionic mobility. Electromigration effects can have desirable uses (1), but also be a problem, for example in IC circuit design (2). However, the increased electronic/ionic mobility can be used to tailor the material properties by modifying e.g. phase formation, phase stability, density of defects etc. Our goal is to understand, by theoretical (DFT calculation) and experimental approaches, and utilize these effects in the processing of hard magnetic materials and to quantify the influence of the electric current on microstructure and magnetic properties. Please click Additional Files below to see the full abstract