Add to ORKGAn IBH personal computer was used es en eutorT\u27l8tic data equlsitlon system for obtaining capacitance voltage (CV) measurements. An HP4145 parameter analyzer was used es en analog to digital converter end the resulting digitized CV data was analyzed on the VAX mainframe
This work is motivated by the need for test cores for advanced CMOS processes characterization, whi...
An Automatic Data Acquisition System for determining the Voltage/Current characteristics of semicond...
A software-based high-voltage curve tracer application for SiC device characterization is presented....
A computer program called CVPLOT, used at RIT to aid in the analysis of metal—oxide—semiconductor (M...
Capacitance-voltage (CV) measurements are used widely as an effective method for Metal-Insulator-Sil...
M.Ing. (Electrical & Electronic Engineering)Measurement techniques and software were developed for t...
A FORTRAN program has been written to manipulate the data obtained from 1 MHZ C—V measurements. This...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
Based on a C8051F006 SoC (system on-a-chip), a simple and low cost quasi-static capacitance-voltage ...
The present paper describes the development of a low cost, highly accurate low capacitance measureme...
Capacitance boxes (CBs) are extensively used in electrical laboratories for calibration of capacitan...
Adequate modeling of a power metal-oxide-semiconductor field-effect transistor (MOSFET) is dependent...
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic...
The voltage current (V-I) characteristics of the photovoltaic array were studied under actual enviro...
This paper presents an overview of questions related to the increase in accuracy of measurements of ...
This work is motivated by the need for test cores for advanced CMOS processes characterization, whi...
An Automatic Data Acquisition System for determining the Voltage/Current characteristics of semicond...
A software-based high-voltage curve tracer application for SiC device characterization is presented....
A computer program called CVPLOT, used at RIT to aid in the analysis of metal—oxide—semiconductor (M...
Capacitance-voltage (CV) measurements are used widely as an effective method for Metal-Insulator-Sil...
M.Ing. (Electrical & Electronic Engineering)Measurement techniques and software were developed for t...
A FORTRAN program has been written to manipulate the data obtained from 1 MHZ C—V measurements. This...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
Based on a C8051F006 SoC (system on-a-chip), a simple and low cost quasi-static capacitance-voltage ...
The present paper describes the development of a low cost, highly accurate low capacitance measureme...
Capacitance boxes (CBs) are extensively used in electrical laboratories for calibration of capacitan...
Adequate modeling of a power metal-oxide-semiconductor field-effect transistor (MOSFET) is dependent...
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic...
The voltage current (V-I) characteristics of the photovoltaic array were studied under actual enviro...
This paper presents an overview of questions related to the increase in accuracy of measurements of ...
This work is motivated by the need for test cores for advanced CMOS processes characterization, whi...
An Automatic Data Acquisition System for determining the Voltage/Current characteristics of semicond...
A software-based high-voltage curve tracer application for SiC device characterization is presented....