AlxGa1-xN (0 axis for samples with AlN contents of 0.15 and 0.77 suggest a relation between the AlN content and Tm specific sites in the lattice. Rapid thermal annealing treatments under N2 ambient were performed to remove damage and promote optical activation of rare earth intra-4fn transitions. After annealing the observed intraionic emissions of Tm3+ ions were characterized by photoluminescence. © 2012 American Institute of Physics.publishe
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
AlN and GaN films were co-implanted with europium and praseodymium ions followed by thermal anneali...
International audienceIn this work we carry out characterization of GaN implanted with Tm and Eu ion...
Eu, Tm and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. Th...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu ions were incorporated into AlN thin films using ion implantation, and the influence of the post-...
AlN with a wide bandgap of 6.2 eV is a promising candidate for ultraviolet light-emitting diodes and...
Partilhar documento na coleção da comunidade Laboratório Associado I3NThe effects of the AlN molar f...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
AlN and GaN films were co-implanted with europium and praseodymium ions followed by thermal anneali...
International audienceIn this work we carry out characterization of GaN implanted with Tm and Eu ion...
Eu, Tm and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. Th...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu, Tin and Er were implanted into AlN-films grown by HVPE on sapphire or MOCVD on GaN substrates. T...
Eu ions were incorporated into AlN thin films using ion implantation, and the influence of the post-...
AlN with a wide bandgap of 6.2 eV is a promising candidate for ultraviolet light-emitting diodes and...
Partilhar documento na coleção da comunidade Laboratório Associado I3NThe effects of the AlN molar f...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
The implantation damage and rare earth (RE) luminescence in the wide band gap ternaries AlGaN and Al...
AlN and GaN films were co-implanted with europium and praseodymium ions followed by thermal anneali...
International audienceIn this work we carry out characterization of GaN implanted with Tm and Eu ion...