On the segmentation of inorganic nanoparticles in TEM micrographs

Transmission electron microscopy provides unique information about the spatial characteristics of inorganic nanoparticles. However, previous work has primarily focused on automatically segmenting isolated nanoparticles from transmission electron microscopy images, with only a minor focus on segmenting individual particles from regions of particle overlap. Towards remedying this deficit, we introduce a novel particle picking device based on the concept of variance hybridized mean local thresholding coupled with serial ellipse fitting. This particle picking device and its components are validated through three separate studies.Chemical Engineerin