Compton profiles of some composite materials normalized by a new method

Recently, we have shown that as a novel approach, in the case of samples which can be treated as pure incoherent scatterers, the effective atomic number Zeff itself could be conveniently used to normalize their un-normalized Compton profiles. In the present investigation, we have attempted to examine the efficacy of this approach. For this purpose, we have first determined the single differential Compton scattering cross sections (SDCS) of the elements C and Al as well as of some H, C, N and O based polymer samples such as bakelite, epoxy, nylon and teflon which are pure incoherent scatterers. The measurements were made at 120° in a goniometer assembly that employs a high resolution high purity germanium detector. The SDCS values were used to obtain the Zeff and the un-normalized Compton profiles. These Compton profiles were separately normalized with their Zeff values (for Compton scattering) as well as with the normalization constant obtained by integrating their Hartree-Fock Biggs et al Compton profiles based on the mixture rule. These two sets of values agreed well within the range of experimental errors, implying that Zeff can be conveniently used to normalize the experimental Compton profiles of pure incoherent scatterers