De-Embedding Techniques for Transmission Lines: An Exploration, Review, and Proposal
- Erickson, Nicholas C.
- Shringarpure, Ketan
- Fan, Jun
- Achkir, Brice
- Pan, Siming
- Hwang, Chulsoon
Publication date
August 2013
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
In this paper, two transmission line based de-embedding techniques are reviewed for application in 3D IC measurements. In particular, full-wave models of extremely small stripline geometries are investigated. The advantages and drawbacks of each method are discussed in reference to simulation results, and a new hybrid method is proposed
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