Add to ORKGIntegrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Near-field magnetic scanning is an effective tool for measuring the current distribution in IC packages and investigating chiplevel EMI problems. This paper discusses analysis of near-magnetic field scan data using tangential and normal field measurements. Results show that combining near-field scan results from probes with multiple orientations is an effective way to identify the current paths in IC packages
In this dissertation, a source reconstruction method is proposed to model the emission behavior of a...
Abstract. This paper introduces a low cost near-field mapping system. This system scans automaticall...
In this article, a method for representing electromagnetic emissions from a device under test (DUT) ...
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems....
Knowledge of high-frequency currents in the chip and chip-package are necessary for EMI analysis and...
Abstract — Integrated circuits (ICs) are often a significant source of radiated energy from electron...
High-frequency currents on the pins of integrated circuits (ICs) and on printed circuit board (PCB) ...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
International audienceThis paper introduces a low cost near-field mapping system. This system scans ...
2 pagesInternational audienceThe paper describes a susceptibility characterization test for integrat...
Near-field probing is often used to determine the sources and coupling paths of an electromagnetic i...
Near-field probing is often used to measure the electric and magnetic fields above a printed circuit...
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic s...
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic s...
For electromagnetic interaction analysis in power electronics, the study and the design of Near-Fiel...
In this dissertation, a source reconstruction method is proposed to model the emission behavior of a...
Abstract. This paper introduces a low cost near-field mapping system. This system scans automaticall...
In this article, a method for representing electromagnetic emissions from a device under test (DUT) ...
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems....
Knowledge of high-frequency currents in the chip and chip-package are necessary for EMI analysis and...
Abstract — Integrated circuits (ICs) are often a significant source of radiated energy from electron...
High-frequency currents on the pins of integrated circuits (ICs) and on printed circuit board (PCB) ...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
International audienceThis paper introduces a low cost near-field mapping system. This system scans ...
2 pagesInternational audienceThe paper describes a susceptibility characterization test for integrat...
Near-field probing is often used to determine the sources and coupling paths of an electromagnetic i...
Near-field probing is often used to measure the electric and magnetic fields above a printed circuit...
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic s...
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic s...
For electromagnetic interaction analysis in power electronics, the study and the design of Near-Fiel...
In this dissertation, a source reconstruction method is proposed to model the emission behavior of a...
Abstract. This paper introduces a low cost near-field mapping system. This system scans automaticall...
In this article, a method for representing electromagnetic emissions from a device under test (DUT) ...