Measurement Techniques to Predict the Soft Failure Susceptibility of an IC Without the Aid of a Complete Software Stack
- Yang, Sen
- Orr, Benjamin
- Guo, Yuangdong
- Zhang, Yaojiang
- Pommerenke, David
- Shumiya, Hideki
- Maeshima, Junji
- Sekine, Taketoshi
- Takita, Yuzo
- Araki, Kenji
Publication date
September 2016
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software
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