Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements
This paper presents an approach to obtain a flat frequency response from the first order derivative ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...
Near-field probing is often used to determine the sources and coupling paths of an electromagnetic i...
A field-response-equivalent circuit is advantageous for explaining the field coupling mechanism of H...
The problems of electronics product because of electromagnetic incompatibility are in-creasing const...
Near-field probing is often used to measure the electric and magnetic fields above a printed circuit...
This paper presents the designing, modeling, and simulation of the spiral circular magnetic field pr...
Current electronic circuits are characterised by their compact design of miniaturisation; however, s...
This study deals with near-field probes integration onto power electronic modules for the magnetic f...
An active electro-optical dipole and loop probe have been developed to measure electromagnetic near-...
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems....
This paper documents the development, characterization, and application of a high-resolution thin-fi...
Near field studies must be carried out to insulate printed circuit boards and other circuits entirel...
An active electro-optical dipole and loop probe have been developed to measure electromagnetic near-...
This paper presents an approach to obtain a flat frequency response from the first order derivative ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...
Near-field probing is often used to determine the sources and coupling paths of an electromagnetic i...
A field-response-equivalent circuit is advantageous for explaining the field coupling mechanism of H...
The problems of electronics product because of electromagnetic incompatibility are in-creasing const...
Near-field probing is often used to measure the electric and magnetic fields above a printed circuit...
This paper presents the designing, modeling, and simulation of the spiral circular magnetic field pr...
Current electronic circuits are characterised by their compact design of miniaturisation; however, s...
This study deals with near-field probes integration onto power electronic modules for the magnetic f...
An active electro-optical dipole and loop probe have been developed to measure electromagnetic near-...
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems....
This paper documents the development, characterization, and application of a high-resolution thin-fi...
Near field studies must be carried out to insulate printed circuit boards and other circuits entirel...
An active electro-optical dipole and loop probe have been developed to measure electromagnetic near-...
This paper presents an approach to obtain a flat frequency response from the first order derivative ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...
Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from ...