This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. The application is dedicated to an electromagnetic field cartography above circuits and the influence of nanometric material layer deposition on the circuits. The first application is associated to a microstrip ring resonator. The results match with the simulated fields. The second application is focused on the effects of a dielectric layer deposited on the circuit and its impact in terms of electromagnetic propagation
This paper outlines how demands on electromagnetic metrology have developed over recent years with t...
Scanning Microwave Microscopy (SMM) is a nanoscale imaging technique that combines the lateral resol...
Les techniques de microscopies hyperfréquences à balayage en champ proche connaissent un intérêt gra...
This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. ...
The Scanning Microwave Microscopy (SMM) is a novel tool providing the ability to perform broad band...
Near-field microwave microscopy is developped in two frequency bands. The first experiment involves ...
Products which require complicated material systems and nanoscale structural organization, e.g. thir...
Ce travail concerne la microscopie en champ proche micro-onde et se déroule dans deux bandes de fréq...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
Abstract: This paper presents number of measurement systems and experimental methods for the investi...
A completely new near field mapping system based on micro monopole antenna has been developed in ord...
PhD ThesesWhile we are gradually approaching the fundamental limit of integrated circuits in classi...
THESIS 6918The topic of this thesis is the development and testing of measurement techniques for hig...
A technique is presented whereby the performance of a microwave device is evaluated by mapping local...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
This paper outlines how demands on electromagnetic metrology have developed over recent years with t...
Scanning Microwave Microscopy (SMM) is a nanoscale imaging technique that combines the lateral resol...
Les techniques de microscopies hyperfréquences à balayage en champ proche connaissent un intérêt gra...
This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. ...
The Scanning Microwave Microscopy (SMM) is a novel tool providing the ability to perform broad band...
Near-field microwave microscopy is developped in two frequency bands. The first experiment involves ...
Products which require complicated material systems and nanoscale structural organization, e.g. thir...
Ce travail concerne la microscopie en champ proche micro-onde et se déroule dans deux bandes de fréq...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
Abstract: This paper presents number of measurement systems and experimental methods for the investi...
A completely new near field mapping system based on micro monopole antenna has been developed in ord...
PhD ThesesWhile we are gradually approaching the fundamental limit of integrated circuits in classi...
THESIS 6918The topic of this thesis is the development and testing of measurement techniques for hig...
A technique is presented whereby the performance of a microwave device is evaluated by mapping local...
A circuit design for technology of near-field interference microwave microscopy using evanescent fie...
This paper outlines how demands on electromagnetic metrology have developed over recent years with t...
Scanning Microwave Microscopy (SMM) is a nanoscale imaging technique that combines the lateral resol...
Les techniques de microscopies hyperfréquences à balayage en champ proche connaissent un intérêt gra...