International audienceReliability is an important issue for safety operation of circuits in critical applications such as military, aerospace, energy, and biomedical engineering. With the rise of failure rate in nanometer CMOS technologies, the need for reliability has become more pressing in the recent years. General design methodologies considers classical criteria such as area, speed, and power consumption. Design for reliability methodologies are often implemented using post-synthesis reliability analysis and simulation tools. In this chapter, an automated system design for reliability is pro- posed. The innovative methodology is capable of identifying the system-level optimum while accounting for considering circuit’s reliability in ea...
The development process of today's microsystem technologies for products includes stages of innovati...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is ...
With shrinking cell geometries, semiconductor devices encounter a wide variety of technical challeng...
International audienceReliability is an important issue for safety operation of circuits in critical...
International audienceReliability is an important issue for safety operation of circuits in critical...
International audienceAssessment of design implications due to degradation of CMOS devices is increa...
This book presents physical understanding, modeling and simulation, on-chip characterization, layout...
International audienceCircuit ageing degradation is becoming worse in advanced technologies, while a...
A design for reliability approach is proposed for fully integrated RF CMOS class A-to-C power amplif...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
Integrated analog circuit design in nanometer CMOS technologies brings forth new and significant rel...
As the technology scales down and the number of circuits grows, the issue of soft errors and reliabi...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling...
The development process of today's microsystem technologies for products includes stages of innovati...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is ...
With shrinking cell geometries, semiconductor devices encounter a wide variety of technical challeng...
International audienceReliability is an important issue for safety operation of circuits in critical...
International audienceReliability is an important issue for safety operation of circuits in critical...
International audienceAssessment of design implications due to degradation of CMOS devices is increa...
This book presents physical understanding, modeling and simulation, on-chip characterization, layout...
International audienceCircuit ageing degradation is becoming worse in advanced technologies, while a...
A design for reliability approach is proposed for fully integrated RF CMOS class A-to-C power amplif...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
Integrated analog circuit design in nanometer CMOS technologies brings forth new and significant rel...
As the technology scales down and the number of circuits grows, the issue of soft errors and reliabi...
Importance of addressing soft errors in both safety critical applications and commercial consumer pr...
The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling...
The development process of today's microsystem technologies for products includes stages of innovati...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is ...
With shrinking cell geometries, semiconductor devices encounter a wide variety of technical challeng...