This paper describes Bayesian methods for life test planning with censored data from a log-location-scale distribution when prior information of the distribution parameters is available. We use a Bayesian criterion based on the estimation precision of a distribution quantile. A large-sample normal approximation gives a simplified, easy-to-interpret, yet valid approach to this planning problem, where in general no closed-form solutions are available. To illustrate this approach, we present numerical investigations using the Weibull distribution with type II censoring. We also assess the effects of prior distribution choice. A simulation approach of the same Bayesian problem is also presented as a tool for visualization and validation. The va...
Reliability demonstration tests require demonstrating, with some level of confidence, that reliabili...
Accelerated life tests (ALTs) are often used to make timely assessments of the life time distributio...
Accelerated Destructive Degradation Tests (ADDTs) provide timely product reliability information in ...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibu...
This dissertation, consisting of three separate papers, describes Bayesian methods for life test pla...
This paper describes a Bayesian method for optimum accelerated life test planning with one accelerat...
This article compares different procedures to compute confidence intervals for parameters and quanti...
In this paper we develop approximate Bayes estimators of the scale parameter of the logistic distrib...
The generalized lognormal distribution plays an important role in various aspects of life testing ex...
This paper compares dierent procedures to compute condence intervals for parameters and quantiles of...
This paper employs Bayesian approach to establish acceptance sampling plans for life tests with inte...
In an earlier statistics roundtable column, the authors described how the conclusions you can draw f...
The exponential-logarithmic is a new lifetime distribution with decreasing failure rate and interest...
[[abstract]]In this paper, we consider the problems of Bayesian estimation and prediction for lognor...
Reliability demonstration tests require demonstrating, with some level of confidence, that reliabili...
Accelerated life tests (ALTs) are often used to make timely assessments of the life time distributio...
Accelerated Destructive Degradation Tests (ADDTs) provide timely product reliability information in ...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibu...
This dissertation, consisting of three separate papers, describes Bayesian methods for life test pla...
This paper describes a Bayesian method for optimum accelerated life test planning with one accelerat...
This article compares different procedures to compute confidence intervals for parameters and quanti...
In this paper we develop approximate Bayes estimators of the scale parameter of the logistic distrib...
The generalized lognormal distribution plays an important role in various aspects of life testing ex...
This paper compares dierent procedures to compute condence intervals for parameters and quantiles of...
This paper employs Bayesian approach to establish acceptance sampling plans for life tests with inte...
In an earlier statistics roundtable column, the authors described how the conclusions you can draw f...
The exponential-logarithmic is a new lifetime distribution with decreasing failure rate and interest...
[[abstract]]In this paper, we consider the problems of Bayesian estimation and prediction for lognor...
Reliability demonstration tests require demonstrating, with some level of confidence, that reliabili...
Accelerated life tests (ALTs) are often used to make timely assessments of the life time distributio...
Accelerated Destructive Degradation Tests (ADDTs) provide timely product reliability information in ...