Self-Testing of Microcontrollers

This Master's thesis deals with functional safety of electronic systems. Specifically, it focuses on self-testing of the microprocessor and its peripherals at the software level. The main aim of the thesis is to design and implement a set of functions written in programming language C or assembly language, which automatically test the selected areas of the microcontroller. Resources and methods used in the implemented solution also aim to meet the requirements according to the safety standard IEC 60730-1, Annex H, Software Class B. The microcontroller NXP LPC55S69 was chosen as a hardware platform. It consists of two ARM Cortex-M33 cores. As a result, the example application is provided, which uses implemented test functions at the run-time. Example application also contains a graphical user interface with fault injection ability