A high-level C++ hardening library is designed for the protection of critical software against the harmful effects of radiation environments that can damage systems. A mathematical and empirical model to predict system behavior in the presence of radiation induced faults is also presented. This model generates a quick evaluation and adjustment of several reliability vs. performance trade-offs, to optimize radiation hardening based on the proposed C++ hardening library. Several simulations and irradiation campaigns with protons and neutrons are used to build the model and to tune it. Finally, the effects of our hardening approach are compared with other hardened and non-hardened approaches.MINECO / FEDER, UE-ESP2015-68245-C4-3-P y ESP...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are...
International audience-Higher density of integration and lower power technologies are becoming more ...
A high-level C++ hardening library is designed for the protection of critical software against the h...
A high-level C++ hardening library is designed for the protection of critical software against the h...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Single Event Upset is a common source of failure in microprocessor-based systems working in environm...
Nowadays, high-performance microprocessors are demanded in many fields, including those with high-re...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are...
HPC device’s reliability is one of the major concerns for supercomputers today and for the next gene...
Traditionally, heavy ion radiation effects affecting digital systems working in safety critical appl...
Computers embedded in satellites are sensitive to cosmic radiations. These cause transient faults th...
This paper presents a metric for the efficient application of selective hardening using software-bas...
Although system-level radiation hardening can enable the use of high-performance components and enha...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are...
International audience-Higher density of integration and lower power technologies are becoming more ...
A high-level C++ hardening library is designed for the protection of critical software against the h...
A high-level C++ hardening library is designed for the protection of critical software against the h...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Single Event Upset is a common source of failure in microprocessor-based systems working in environm...
Nowadays, high-performance microprocessors are demanded in many fields, including those with high-re...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are...
HPC device’s reliability is one of the major concerns for supercomputers today and for the next gene...
Traditionally, heavy ion radiation effects affecting digital systems working in safety critical appl...
Computers embedded in satellites are sensitive to cosmic radiations. These cause transient faults th...
This paper presents a metric for the efficient application of selective hardening using software-bas...
Although system-level radiation hardening can enable the use of high-performance components and enha...
All-Programmable System-on-Chips (APSoCs) constitute a compelling option for employing applications ...
Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are...
International audience-Higher density of integration and lower power technologies are becoming more ...