International audienceThis work takes place in the general context of a better understanding of materials degradation mechanisms in extreme environments. In particular, the aim of the present study was to correlate microstructural elements to growth stress magnitude evolution and stress release mechanisms for thermally grown chromia thin films on NiCr alloys. Strains in thermally grown oxides have been measured in-situ, as the oxides develop and evolve. Data have been acquired from oxides grown for different high temperatures evolutions on NiCr model alloys that form Cr2O3. Using synchrotron X-Ray at the ESRF (Beamline BM02) coupled with an induction furnace, Debye-Scherrer diffraction patterns from the oxidizing specimen were recorded in a...
The growth and oxidation of Cr films on the W(100) surface have been studied with low energy electro...
L’intégrité des couches protectrices d’oxyde thermiques se développant à haute température à la surf...
In this work, the surface morphology changes of nanocrystalline Cr2O3 film deposited on Si wafer dur...
In this work, growth stresses have been investigated in relation with the microstructure in the case...
Growth stresses have been investigated in relation with the microstructure in the case of α -Cr2 O3 ...
The present study investigates damage mechanisms for chromia thin thermal oxide films formed during ...
Abstract. The presence of residual stresses in thermal oxide layers has been recognized for a long t...
The blistering phenomenon has been studied in chromia films formed between 700 and 900 °C on Ni-33at...
International audienceFor high temperature materials such as metallic Fe-Cr and Ni-Cr alloys, the ox...
Residual stresses have been determined both in metal and oxide in different oxide/metal systems. Mea...
NiCr alloys develop chromia layers in oxidizing high temperature environments. The stress in oxide l...
Integrity of protective oxide scales developing at the metallic alloys surface at high temperature d...
International audienceThe viscoplastic behaviour of the model yttria-coated Ni28Cr alloy was studied...
Spontaneous delamination process for α-Cr2O3 thermal oxide films growing on NiCr-30 alloys is studie...
Mechanical features have been investigated in the case of α - Cr2 O3 thermal oxide films growing on ...
The growth and oxidation of Cr films on the W(100) surface have been studied with low energy electro...
L’intégrité des couches protectrices d’oxyde thermiques se développant à haute température à la surf...
In this work, the surface morphology changes of nanocrystalline Cr2O3 film deposited on Si wafer dur...
In this work, growth stresses have been investigated in relation with the microstructure in the case...
Growth stresses have been investigated in relation with the microstructure in the case of α -Cr2 O3 ...
The present study investigates damage mechanisms for chromia thin thermal oxide films formed during ...
Abstract. The presence of residual stresses in thermal oxide layers has been recognized for a long t...
The blistering phenomenon has been studied in chromia films formed between 700 and 900 °C on Ni-33at...
International audienceFor high temperature materials such as metallic Fe-Cr and Ni-Cr alloys, the ox...
Residual stresses have been determined both in metal and oxide in different oxide/metal systems. Mea...
NiCr alloys develop chromia layers in oxidizing high temperature environments. The stress in oxide l...
Integrity of protective oxide scales developing at the metallic alloys surface at high temperature d...
International audienceThe viscoplastic behaviour of the model yttria-coated Ni28Cr alloy was studied...
Spontaneous delamination process for α-Cr2O3 thermal oxide films growing on NiCr-30 alloys is studie...
Mechanical features have been investigated in the case of α - Cr2 O3 thermal oxide films growing on ...
The growth and oxidation of Cr films on the W(100) surface have been studied with low energy electro...
L’intégrité des couches protectrices d’oxyde thermiques se développant à haute température à la surf...
In this work, the surface morphology changes of nanocrystalline Cr2O3 film deposited on Si wafer dur...