Manufacturing and environmental variations cause timing errors in microelectronic processors that are typically avoided by ultra-conservative multi-corner design margins or corrected by error detection and recovery mechanisms at the circuit-level. In contrast, we present here runtime software support for cost-effective countermeasures against hardware timing failures during system operation. We propose a variability-aware OpenMP (VOMP) programming environment, suitable for tightly-coupled shared memory processor clusters, that relies upon modeling across the hardware/software interface. VOMP is implemented as an extension to the OpenMP v3.0 programming model that covers various parallel constructs, including , , and . Using the ...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring m...
Manufacturing and environmental variations cause timing errors in microelectronic processors that a...
Abstract—Manufacturing and environmental variations cause timing errors in microelectronic processor...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
We present a variation-tolerant tasking technique for tightly-coupled shared memory processor cluste...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
We propose a tightly-coupled, multi-core cluster architecture with shared, variation-tolerant, and a...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
The recent growth in the number of precessing units in today's multicore processor architectures ena...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring m...
Manufacturing and environmental variations cause timing errors in microelectronic processors that a...
Abstract—Manufacturing and environmental variations cause timing errors in microelectronic processor...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
We present a variation-tolerant tasking technique for tightly-coupled shared memory processor cluste...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
We propose a tightly-coupled, multi-core cluster architecture with shared, variation-tolerant, and a...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
It is getting increasingly difficult to verify processors and guarantee subsequent reliable operatio...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
The recent growth in the number of precessing units in today's multicore processor architectures ena...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring m...