none3siDate of Publication: 31 maggio 2013This paper proposes a near-zero area overhead adaptive guardbanding technique to combat CMOS variability for errortolerant (probabilistic) applications as well as traditional error-intolerant applications. The proposed technique leverages a combination of accurate design time analysis and a minimally intrusive runtime technique to mitigate Process, Voltage, and Temperature (PVT) variations. We demonstrate our approach on a 32-bit in-order RISC processor with full post Placement and Routing (P&R) layout results in 45nm TSMC technology. The adaptive guardbanding technique eliminates conservative guardbands on frequency due to PVT variations, thus increases the throughput of probabilistic applic...
Adaptive circuit design technique and error-tolerant computing have both been suggested as potential...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Performance and power efficiency are two of the most critical aspects of computing systems. Moore's ...
Distributed arithmetic (DA) brings area and power benefits to digital designs relevant to the Intern...
none3siThis paper proposes a new model of functional units for variation-induced timing errors due t...
Distributed arithmetic (DA) brings area and power benefits to digital designs relevant to the Intern...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
......Microprocessors must operate re-liably across a wide range of environmental conditions and wor...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Adaptive circuit design technique and error-tolerant computing have both been suggested as potential...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Performance and power efficiency are two of the most critical aspects of computing systems. Moore's ...
Distributed arithmetic (DA) brings area and power benefits to digital designs relevant to the Intern...
none3siThis paper proposes a new model of functional units for variation-induced timing errors due t...
Distributed arithmetic (DA) brings area and power benefits to digital designs relevant to the Intern...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
One of the challenges faced today in the design of microprocessors is to obtain power, performance s...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
Variation in performance and power across manufactured parts and their operating conditions is an ac...
......Microprocessors must operate re-liably across a wide range of environmental conditions and wor...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Adaptive circuit design technique and error-tolerant computing have both been suggested as potential...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...