In this work we investigate the ballistic ratio and the backscattering coefficient in nanowire FETs operating under quasi-ballistic conditions. Starting from general expressions of the current–voltage characteristics worked out in a previous paper, we extract the above parameters and their functional dependence on inversion-layer charge and device length. The computation is based on a rigorous analytic solution of the BTE and on a numerical solution of the coupled Schroedinger–Poisson equations, by which multiple subbands are taken into account. We propose three different definitions of the ballistic ratio, clarify their meaning and compute their values against the gate voltage and the device length. As opposed to most phenomenological tr...
Abstract—We propose an efficient and fast algorithm to solve the coupled Poisson–Schrödinger and Bol...
International audienceA new fully experimental method to determine the backscattering coefficient an...
none6In this paper we investigate the effect of surface roughness scattering on transport in silicon...
In this work we investigate the ballistic ratio and the backscattering coefficient in nanowire FETs ...
In this work we investigate the ballistic ratio and the backscattering coefficient in nanowire FETs ...
none4In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW...
none4In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW...
In this paper, the ballistic and quasi-ballistic transport characteristics of Sub-30 nm double gate ...
In this paper we investigate the transport properties of silicon nanowire FETs by using two differen...
7th International Conference on Ultimate Integration on Silicon, Grenoble, FRANCE, APR 20-21, 2006In...
In this paper we investigate the transport properties of silicon nanowire FETs by using two differe...
Abstract—The scattering effects are studied in nanometer-scaled double-gate MOSFET using Monte Carlo...
none4In this paper, we investigate the electron mobility in nanowire (NW) FETs operating under quasi...
As the feature lengths of the field-effect transistors (FETs) are scaled down to the deca-nanometer ...
In this paper, we have proposed a new analytical model for FETs working in the quasi-ballistic regim...
Abstract—We propose an efficient and fast algorithm to solve the coupled Poisson–Schrödinger and Bol...
International audienceA new fully experimental method to determine the backscattering coefficient an...
none6In this paper we investigate the effect of surface roughness scattering on transport in silicon...
In this work we investigate the ballistic ratio and the backscattering coefficient in nanowire FETs ...
In this work we investigate the ballistic ratio and the backscattering coefficient in nanowire FETs ...
none4In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW...
none4In this work we investigate quasi-ballistic transport in nanowire field-effect transistors (NW...
In this paper, the ballistic and quasi-ballistic transport characteristics of Sub-30 nm double gate ...
In this paper we investigate the transport properties of silicon nanowire FETs by using two differen...
7th International Conference on Ultimate Integration on Silicon, Grenoble, FRANCE, APR 20-21, 2006In...
In this paper we investigate the transport properties of silicon nanowire FETs by using two differe...
Abstract—The scattering effects are studied in nanometer-scaled double-gate MOSFET using Monte Carlo...
none4In this paper, we investigate the electron mobility in nanowire (NW) FETs operating under quasi...
As the feature lengths of the field-effect transistors (FETs) are scaled down to the deca-nanometer ...
In this paper, we have proposed a new analytical model for FETs working in the quasi-ballistic regim...
Abstract—We propose an efficient and fast algorithm to solve the coupled Poisson–Schrödinger and Bol...
International audienceA new fully experimental method to determine the backscattering coefficient an...
none6In this paper we investigate the effect of surface roughness scattering on transport in silicon...