A new distributed on-line test mechanism for NoCs is proposed which scales to large-scale networks with general topologies and routing algorithms. Each router and its links are tested using neighbors in different phases. Only the router under test is in test mode and all other parts of the NoC are in functional mode. Experimental results show that our on-line test approach can detect stuck-at and short-wire faults in the routers and links. Our approach achieves 100% fault coverage for the data-path and 85% for the control paths including routing logic, FIFO's control path and the arbiter of a 5 75 router. Synthesis results show that the hardware overhead of our test components with TMR (Triple Module Redundancy) support is 20% for covering ...
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of N...
This paper proposes a built-in self-test/self-diagnosis procedure at start-up of an on-chip network ...
Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective tes...
none3siIn this work, we propose a distributed functional test mechanism for NoCs which scales to lar...
Abstract—In this work, we propose a distributed functional test mechanism for NoCs which scales to l...
This thesis presented a new method for testing routers and cores on Network-On-Chip (NoC) systems.It...
Due to recent progress in semiconductor technology, communication is becoming the major source of ex...
International audienceAsynchronous design offers an attractive solution to overcome the problems fac...
The demands of future computing, as well as the challenges of nanometer-era VLSI design, will requir...
© ACM, 2013. This is the author's version of the work. It is posted here by permission of ACM for yo...
Abstract—Network-on-chip (NoC) communication fabrics will be increasingly used in many large multico...
Modern Networks-on-Chip (NoC) have the capability to tolerate and adapt to the faults and failures i...
A key requirement for modern Networks-on-Chip (NoC) is the ability to detect and diagnose faults and...
Packet-based on-chip interconnection networks, or Network-on-Chips (NoCs) are progressively replacin...
In some application domains (e.g., mission-critical systems), proactive detection of reliability thr...
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of N...
This paper proposes a built-in self-test/self-diagnosis procedure at start-up of an on-chip network ...
Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective tes...
none3siIn this work, we propose a distributed functional test mechanism for NoCs which scales to lar...
Abstract—In this work, we propose a distributed functional test mechanism for NoCs which scales to l...
This thesis presented a new method for testing routers and cores on Network-On-Chip (NoC) systems.It...
Due to recent progress in semiconductor technology, communication is becoming the major source of ex...
International audienceAsynchronous design offers an attractive solution to overcome the problems fac...
The demands of future computing, as well as the challenges of nanometer-era VLSI design, will requir...
© ACM, 2013. This is the author's version of the work. It is posted here by permission of ACM for yo...
Abstract—Network-on-chip (NoC) communication fabrics will be increasingly used in many large multico...
Modern Networks-on-Chip (NoC) have the capability to tolerate and adapt to the faults and failures i...
A key requirement for modern Networks-on-Chip (NoC) is the ability to detect and diagnose faults and...
Packet-based on-chip interconnection networks, or Network-on-Chips (NoCs) are progressively replacin...
In some application domains (e.g., mission-critical systems), proactive detection of reliability thr...
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of N...
This paper proposes a built-in self-test/self-diagnosis procedure at start-up of an on-chip network ...
Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective tes...