The role of reliability prediction during the design stage of a system is worldwide recognized. Simulation tools and proper experimental approaches are usually applied to get reliability properties. In this paper, an experimental method relying on the use the dynamic stress-strength approach is presented and applied on a simple electronic device. The obtained results are presented and discussed
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Abstract An element fails as soon as the applied stress is at least as much as the strength of the ...
Increasingly modern electronic equipment is expected to provide more functionality whilst still bein...
AbstractSome new ideas and thoughts concerning the definition and calculation of reliability for str...
This paper reports on a setup and a method that enables automated analysis of mechanical stress impa...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
In this paper we study stress-strength reliability for a general coherent system. The exact expressi...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Abstract An element fails as soon as the applied stress is at least as much as the strength of the ...
Increasingly modern electronic equipment is expected to provide more functionality whilst still bein...
AbstractSome new ideas and thoughts concerning the definition and calculation of reliability for str...
This paper reports on a setup and a method that enables automated analysis of mechanical stress impa...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper discusses a new reliability model for power system devices for which a physical ageing mod...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
In this paper we study stress-strength reliability for a general coherent system. The exact expressi...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Abstract An element fails as soon as the applied stress is at least as much as the strength of the ...