Add to ORKGnone4Clock compensation for process variations and manufacturing defects is a key strategy to achieve high performance of processors and high end ASIC. However, with the increase in process variations and defect densities, clock compensation is becoming increasingly challenging. A clock distribution system also consumes over 30% of the overall chip level power, so every little bit counts, including compensation schemes. In this paper we propose a new scheme for the compensation of undesirable skews and duty-cycle variations of local clocks of high performance microprocessors and high end ASICs. Our scheme performs compensation continuously, during the microprocessor operation, thus allowing also compensation to clock jitters du...
In this paper we present a novel approach for testing clock faults for high performance microproces...
Over the last four decades the integrated circuit industry has evolved in a tremendous pace. This su...
We propose a new design for testability approach for testing clock faults of next generation high pe...
none4We propose a low cost scheme for the dynamic compensation in the field of undesired skew and du...
The continuous scaling of microelectronics technology allows for keeping on increasing IC performanc...
Synchronous clock distribution continues to be the dominant timing methodology for very large scale ...
The Smartphone revolution and the Internet of Things (IoTs) have triggered rapid advances in complex...
Clock generation and distribution are getting difficult due to increased die size and increased numb...
We propose a clock buffer that is able to compensate clock skews possibly due to process variations,...
Growing power dissipation and clock instability are resisting the continued scaling of high-performa...
In today’s high performance (multi-GHz) microprocessors’ design, on-chip clock calibration features ...
In today's high performance (multi-GHz) microprocessors' design, on-chip clock calibration features ...
Abstract—Process variability and environmental fluctuations deeply affect the digital circuits perfo...
In today’s high performance (multi-GHz) microprocessors’ design, on-chip clock calibration features ...
In today's high performance (multi-GHz) microprocessors' design, on-chip clock calibration features ...
In this paper we present a novel approach for testing clock faults for high performance microproces...
Over the last four decades the integrated circuit industry has evolved in a tremendous pace. This su...
We propose a new design for testability approach for testing clock faults of next generation high pe...
none4We propose a low cost scheme for the dynamic compensation in the field of undesired skew and du...
The continuous scaling of microelectronics technology allows for keeping on increasing IC performanc...
Synchronous clock distribution continues to be the dominant timing methodology for very large scale ...
The Smartphone revolution and the Internet of Things (IoTs) have triggered rapid advances in complex...
Clock generation and distribution are getting difficult due to increased die size and increased numb...
We propose a clock buffer that is able to compensate clock skews possibly due to process variations,...
Growing power dissipation and clock instability are resisting the continued scaling of high-performa...
In today’s high performance (multi-GHz) microprocessors’ design, on-chip clock calibration features ...
In today's high performance (multi-GHz) microprocessors' design, on-chip clock calibration features ...
Abstract—Process variability and environmental fluctuations deeply affect the digital circuits perfo...
In today’s high performance (multi-GHz) microprocessors’ design, on-chip clock calibration features ...
In today's high performance (multi-GHz) microprocessors' design, on-chip clock calibration features ...
In this paper we present a novel approach for testing clock faults for high performance microproces...
Over the last four decades the integrated circuit industry has evolved in a tremendous pace. This su...
We propose a new design for testability approach for testing clock faults of next generation high pe...