Add to ORKGnone10noneA. Castaldini; A. Cavallini; L. Rigutti; M. Meneghini; S.Levada; E. Zanoni; G. Meneghesso; V. Haerle; T. Zahner; U. ZehnderA. Castaldini; A. Cavallini; L. Rigutti; M. Meneghini; S.Levada; E. Zanoni; G. Meneghesso; V. Haerle; T. Zahner; U. Zehnde
Optical and electrical properties of high brightness blue InGaN/GaN LEDs submitted to high direct cu...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
Self heating during long-term DC-aging is found to be responsible for the degradation of the electr...
We present a combined Capacitance-Voltage (C-V), Deep Level Transient Spectroscopy (DLTS) and Photoc...
In this paper we present a combined current-voltage, capacitance-voltage, Deep Level Transient Spect...
This work describes an experiment on degradation mechanisms of InGaN light-emitting diode LED test s...
In this paper we present a combined current-voltage, capacitance-voltage, Deep Level Transient Spect...
We present a combined capacitance-voltage, Deep Level Transient Spectroscopy (DLTS) and electrolumin...
We present a combined capacitance-voltage, Deep Level Transient Spectroscopy (DLTS) and electrolumin...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
Optical power of violet light emitting diodes were measured during DC aging test up to 312 h at diff...
National High Technology Development Program of China [2006AA03A175]; Special Foundation for Major P...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
The electrical and optical properties of commercial blue InGaN-based LEDs after room temperature agi...
Changes in the optical performances of blue light-emitting diodes based on InGaN/AlGaN/GaN heterostr...
Optical and electrical properties of high brightness blue InGaN/GaN LEDs submitted to high direct cu...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
Self heating during long-term DC-aging is found to be responsible for the degradation of the electr...
We present a combined Capacitance-Voltage (C-V), Deep Level Transient Spectroscopy (DLTS) and Photoc...
In this paper we present a combined current-voltage, capacitance-voltage, Deep Level Transient Spect...
This work describes an experiment on degradation mechanisms of InGaN light-emitting diode LED test s...
In this paper we present a combined current-voltage, capacitance-voltage, Deep Level Transient Spect...
We present a combined capacitance-voltage, Deep Level Transient Spectroscopy (DLTS) and electrolumin...
We present a combined capacitance-voltage, Deep Level Transient Spectroscopy (DLTS) and electrolumin...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
Optical power of violet light emitting diodes were measured during DC aging test up to 312 h at diff...
National High Technology Development Program of China [2006AA03A175]; Special Foundation for Major P...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
The electrical and optical properties of commercial blue InGaN-based LEDs after room temperature agi...
Changes in the optical performances of blue light-emitting diodes based on InGaN/AlGaN/GaN heterostr...
Optical and electrical properties of high brightness blue InGaN/GaN LEDs submitted to high direct cu...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
Self heating during long-term DC-aging is found to be responsible for the degradation of the electr...