In this work, PFM is used for evaluating the piezoelectric constant of P(VDF-TrFE) - which is part of the tactile sensors that we developed in past. The piezoelectric constant (d33) and the electrostictive parameter (γ) are measured by applying AC+DC voltage across the polymer and detecting the deformation of sample
The development of piezoelectric materials has enabled new realms of fine precision motors, sensors,...
Tesis Doctoral inédita leída en la Universidad Autónoma de Madrid, Facultad de Ciencias, Departament...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
This paper presents the results from dynamic measurements of piezoelectric constant d33 using Atomic...
A simple experimental method for piezoresponse force microscopy (PFM) measurements for reliable eval...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
In Atomic Force Acoustic Microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
In atomic force acoustic microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) c...
This article introduces a technique for observing and quantifying the piezoelectric response of thin...
The development of piezoelectric materials has enabled new realms of fine precision motors, sensors,...
Tesis Doctoral inédita leída en la Universidad Autónoma de Madrid, Facultad de Ciencias, Departament...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
This paper presents the results from dynamic measurements of piezoelectric constant d33 using Atomic...
A simple experimental method for piezoresponse force microscopy (PFM) measurements for reliable eval...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
In Atomic Force Acoustic Microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
In atomic force acoustic microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) c...
This article introduces a technique for observing and quantifying the piezoelectric response of thin...
The development of piezoelectric materials has enabled new realms of fine precision motors, sensors,...
Tesis Doctoral inédita leída en la Universidad Autónoma de Madrid, Facultad de Ciencias, Departament...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...