Add to ORKGThe reliability of RF MEMS switches is typically reduced by charging effects occurring in the dielectrics. The aim of this paper is to discuss these effects, and to propose an equivalent circuit model which accounts for most of the physical contributions present in the structure
The continuously evolving MEMS technology for RF/microwave applications poses issues regarding new...
International audienceDielectric charging is a key failure mechanism in radio frequency (RF) microel...
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by h...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
Charging effects in dielectrics are currently considered as the major limiting factor for the reliab...
Charging effects in dielectrics are currently considered as the major limiting factor for the reliab...
Dielectric charges cause stiction problems in most capacitive RF-MEMS switches, creating a major rel...
RF MEMS switch is becoming the preferred choice for RF switching due to its outstanding performance ...
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by h...
Abstract — The reliability of electrostatically actuated RF MEMS switches is reviewed with emphasis...
Abstract—To design and validate accelerated life tests of RF MEMS capacitive switches, acceleration ...
The continuously evolving MEMS technology for RF/microwave applications poses issues regarding new...
International audienceDielectric charging is a key failure mechanism in radio frequency (RF) microel...
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by h...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the diele...
Charging effects in dielectrics are currently considered as the major limiting factor for the reliab...
Charging effects in dielectrics are currently considered as the major limiting factor for the reliab...
Dielectric charges cause stiction problems in most capacitive RF-MEMS switches, creating a major rel...
RF MEMS switch is becoming the preferred choice for RF switching due to its outstanding performance ...
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by h...
Abstract — The reliability of electrostatically actuated RF MEMS switches is reviewed with emphasis...
Abstract—To design and validate accelerated life tests of RF MEMS capacitive switches, acceleration ...
The continuously evolving MEMS technology for RF/microwave applications poses issues regarding new...
International audienceDielectric charging is a key failure mechanism in radio frequency (RF) microel...
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by h...