Scanning Electron Microscopy. The purpose of this paper is to describe some applications of scanning electron microscopy to surface studies and crystallographic observations. Operative modes are discussed.On décrit quelques applications du microscope électronique à balayage à l'étude topographique des surfaces et à la cristallographie. Les conditions d'utilisation sont précisées.Vicario Edmond, Pitaval Michel, Fontaine Gérard. Microscopie électronique à balayage. In: Bulletin de la Société française de Minéralogie et de Cristallographie, volume 94, 3, 1971. Réunion annuelle de l'Association Française de Cristallographie Grenoble, 25-27 mai 1970
The detection of Auger electrons in a scanning electron microscope in order to form chemically spec...
On présente ici une méthode temps-réel de traitement des images obtenues par un microscope électroni...
Applications of SEM techniques of microcharacterization have proliferated to cover every type of mat...
Scanning Electron Microscopy. The purpose of this paper is to describe some applications of scannin...
The principle of transmission electron microscopy is summarized. Preparation methods specially used ...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
The combination of methods for surface analysis with electron microscopes (EM) gives the possibility...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
The microstructural characterization by microscopic techniques is an essential requirement for mater...
Work at the University of Sussex involving instrumental developments in scanning electron microscopy...
Work at the University of Sussex involving instrumental developments in scanning electron microscopy...
Contains fulltext : mmubn000001_194246256.pdf (publisher's version ) (Open Access)...
The chemical analysis of a very small area of a specimen requires simultaneous observation of this s...
In this paper the authors discuss how the dedicated scanning transmission electron microscope can pr...
The detection of Auger electrons in a scanning electron microscope in order to form chemically spec...
On présente ici une méthode temps-réel de traitement des images obtenues par un microscope électroni...
Applications of SEM techniques of microcharacterization have proliferated to cover every type of mat...
Scanning Electron Microscopy. The purpose of this paper is to describe some applications of scannin...
The principle of transmission electron microscopy is summarized. Preparation methods specially used ...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
The combination of methods for surface analysis with electron microscopes (EM) gives the possibility...
We describe an analytical electron microscope, based on the ESCA principle, and specially useful for...
The microstructural characterization by microscopic techniques is an essential requirement for mater...
Work at the University of Sussex involving instrumental developments in scanning electron microscopy...
Work at the University of Sussex involving instrumental developments in scanning electron microscopy...
Contains fulltext : mmubn000001_194246256.pdf (publisher's version ) (Open Access)...
The chemical analysis of a very small area of a specimen requires simultaneous observation of this s...
In this paper the authors discuss how the dedicated scanning transmission electron microscope can pr...
The detection of Auger electrons in a scanning electron microscope in order to form chemically spec...
On présente ici une méthode temps-réel de traitement des images obtenues par un microscope électroni...
Applications of SEM techniques of microcharacterization have proliferated to cover every type of mat...