Antiphase boundaries formed in the course of growth and cooling of single crystals of Fe-Si alloys containing from 10 to 24 atomes % Si were studied. They were chiefly examined by transmission electron microscopy. It is shown that the contrast of boundaries with displacement vectors 1/4 a'₀ and 1/2 a'₀ approximately parallel to the electron beam is qualitatively different for high and low Si contents. These boundaries with vector 1/2 a'₀ show an anomalous contrast even in superlattice reflections for which theory predicts zero contrast. In a certain concentration region the boundaries of both types have preferred crystallographic orientations (planes {100}). Some contrast of boundaries was observed even in the fundamental reflections. ...
International audienceThe growth of thin Fe films deposited at oblique incidence on an iron silicide...
De récents travaux consacrés à l’étude des propriétés des matériaux aux petites échelles ont soulign...
This paper forms a final report on our studies on grain boundaries in silicon by electron microscope...
An ultra-high tension electron microscopy observation of CuSi 4 % alloys has led us to study the dif...
International audienceWe have investigated quantitatively anti-phase domains (APD) structural proper...
Abstract—The Gibbsian interfacial excess of silicon (ÿSi) was determined, on an atomic scale, for 14...
The study by electron microscopy of the fringes due to planar defects such as antiphase boundaries (...
grantor: University of TorontoThe structures of grain boundaries were characterized within...
This paper aims to the description of the diffraction phenomenon produced by lamellar systems contai...
By means of X-ray topographic methods it has been previously demonstrated [B. Capelle, C. Malgrange,...
Convergent-beam electron diffraction (CBED) has been applied in grain boundary structure determinati...
We present a method combining chemical lattice imaging, using high resolution electron microscopy, a...
The contrast in transmission electron microscopy for small, square inclusions in an aluminium matrix...
This paper summarizes the electron microscope observations (high resolution, diffraction and α-fring...
Amorphous Fe100-x-ySi yBx alloys have been studied by Môssbauer Spectroscopy. The fitting methods an...
International audienceThe growth of thin Fe films deposited at oblique incidence on an iron silicide...
De récents travaux consacrés à l’étude des propriétés des matériaux aux petites échelles ont soulign...
This paper forms a final report on our studies on grain boundaries in silicon by electron microscope...
An ultra-high tension electron microscopy observation of CuSi 4 % alloys has led us to study the dif...
International audienceWe have investigated quantitatively anti-phase domains (APD) structural proper...
Abstract—The Gibbsian interfacial excess of silicon (ÿSi) was determined, on an atomic scale, for 14...
The study by electron microscopy of the fringes due to planar defects such as antiphase boundaries (...
grantor: University of TorontoThe structures of grain boundaries were characterized within...
This paper aims to the description of the diffraction phenomenon produced by lamellar systems contai...
By means of X-ray topographic methods it has been previously demonstrated [B. Capelle, C. Malgrange,...
Convergent-beam electron diffraction (CBED) has been applied in grain boundary structure determinati...
We present a method combining chemical lattice imaging, using high resolution electron microscopy, a...
The contrast in transmission electron microscopy for small, square inclusions in an aluminium matrix...
This paper summarizes the electron microscope observations (high resolution, diffraction and α-fring...
Amorphous Fe100-x-ySi yBx alloys have been studied by Môssbauer Spectroscopy. The fitting methods an...
International audienceThe growth of thin Fe films deposited at oblique incidence on an iron silicide...
De récents travaux consacrés à l’étude des propriétés des matériaux aux petites échelles ont soulign...
This paper forms a final report on our studies on grain boundaries in silicon by electron microscope...