A new type of high voltage termination, namely the “deep p-ring trench” termination design for high voltage, high power devices is presented and extensively simulated. Termination of such devices consumes a large proportion of the chip size; the proposed design concept not only reduces the termination silicon area required, it also removes the need for an additional mask as is the case of the traditional p+ ring type termination. Furthermore, the presence of the p-ring under and around the bottom of the trench structure reduces the electric field peaks at the corners of the oxide which results in reduced hot carrier injection and improved device reliabilit
In this study, a robust double-ring junction-termination-extension (DR-JTE) for highvoltage pn-diode...
2012 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2012), June 3-7, 201...
International audienceA new junction termination for high-voltage devices using a deep trench filled...
A new type of high-voltage termination, namely the 'deep p-ring trench' termination design for high-...
The 22nd International Symposium on Power Semiconductor Devices & Ics (ISPSD2010), 6月6日-10日, 2010年, ...
A major limitation on the performance of high-voltage power semiconductor is the edge termination of...
[[abstract]]In this study, a novel termination is designed in a low-voltage N-channel trench power m...
International audienceTo fully achieve the performance which SiC power devices potentially have, it ...
Abstract — Numerous techniques have been used to improve the voltage handling capability of high vol...
International audienceUsing finite element simulations with Sentaurus TCAD (Technology Computer-Aide...
In this paper, a floating ring edge termination structure using minimally sized lightly doped p-ring...
International audienceDeep trench terminations are commonly known as a technique to achieve ideal br...
This work presents the design methodology and performance of a compact edge termination structure ai...
International audienceAmong the numerous solutions developed to improve the handling capability of s...
Among the numerous solutions developed to improve the voltage handling capability of superjunction p...
In this study, a robust double-ring junction-termination-extension (DR-JTE) for highvoltage pn-diode...
2012 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2012), June 3-7, 201...
International audienceA new junction termination for high-voltage devices using a deep trench filled...
A new type of high-voltage termination, namely the 'deep p-ring trench' termination design for high-...
The 22nd International Symposium on Power Semiconductor Devices & Ics (ISPSD2010), 6月6日-10日, 2010年, ...
A major limitation on the performance of high-voltage power semiconductor is the edge termination of...
[[abstract]]In this study, a novel termination is designed in a low-voltage N-channel trench power m...
International audienceTo fully achieve the performance which SiC power devices potentially have, it ...
Abstract — Numerous techniques have been used to improve the voltage handling capability of high vol...
International audienceUsing finite element simulations with Sentaurus TCAD (Technology Computer-Aide...
In this paper, a floating ring edge termination structure using minimally sized lightly doped p-ring...
International audienceDeep trench terminations are commonly known as a technique to achieve ideal br...
This work presents the design methodology and performance of a compact edge termination structure ai...
International audienceAmong the numerous solutions developed to improve the handling capability of s...
Among the numerous solutions developed to improve the voltage handling capability of superjunction p...
In this study, a robust double-ring junction-termination-extension (DR-JTE) for highvoltage pn-diode...
2012 24th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2012), June 3-7, 201...
International audienceA new junction termination for high-voltage devices using a deep trench filled...