Optimal decisions on the accelerated degradation test plan under the Wiener Process

[[abstract]]The cumulative damage of highly reliable products that subject to multiple loading stresses is investigated under Wiener process. Optimal strategies on the constant-stress accelerated degradation test plan are established to reach a compromised decision between the experiment budget and the estimation precision on the reliability inference. An algorithm is provided to search an optimal strategy for the accelerated degradation test. An example of light emitting diodes is used for illustrating the application of the proposed method.[[notice]]補正完畢[[incitationindex]]SCI[[ispeerreviewed]]