[[abstract]]In this paper, new compression architecture is proposed for multiple scan-chains. We use buffers to hold back data, and use read enable signals to filter useless data. We use only four extra channels and less hardware for largest ISCAS'89 circuits to reduce test data volume and shift-in power. The average of peak/WTC shift-in turns to 3x/6.6x, after comparing (Wang and Chakrabarty, 2008) and our method. The average of improvement/ hardware is 16%/6%.[[sponsorship]]IEEE Computer Society Test Technology Thchnical Council; IEEE Philadelphia Section[[conferencetype]]國際[[conferencedate]]20091101~20091106[[booktype]]紙本[[booktype]]電子版[[iscallforpapers]]Y[[conferencelocation]]Austin, Texas US
This paper presents a new technique for power minimization during test application in sequential cir...
[[abstract]]This paper proposes a novel method to reduce the peak power of multiple scan chain based...
Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-...
[[abstract]]As the test data continues to grow quickly, test cost also increased. For the sake of de...
[[abstract]]Generally speaking, the dependency data compression is very useful for Intellectual Prop...
[[abstract]]As test data continues to grow quickly, test cost also increases. For the sake of decrea...
Various test data compression techniques have been developed to reduce the test costs of system-on-a...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
Abstract—In modern chip designs, test strategies are becoming one of the most important issues due t...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Abstract—The degree of achievable test-data compression de-pends on not only the compression scheme ...
[[abstract]]This paper presents a low power strategy for test data compression and a new decompressi...
In this paper chain-based power-aware test compression technique is proposed, with low area overhead...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
This paper presents a new technique for power minimization during test application in sequential cir...
[[abstract]]This paper proposes a novel method to reduce the peak power of multiple scan chain based...
Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-...
[[abstract]]As the test data continues to grow quickly, test cost also increased. For the sake of de...
[[abstract]]Generally speaking, the dependency data compression is very useful for Intellectual Prop...
[[abstract]]As test data continues to grow quickly, test cost also increases. For the sake of decrea...
Various test data compression techniques have been developed to reduce the test costs of system-on-a...
Symbol-based and linear-based test-data compression techniques have complementary properties which a...
Abstract—In modern chip designs, test strategies are becoming one of the most important issues due t...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Abstract—The degree of achievable test-data compression de-pends on not only the compression scheme ...
[[abstract]]This paper presents a low power strategy for test data compression and a new decompressi...
In this paper chain-based power-aware test compression technique is proposed, with low area overhead...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
This paper presents a new technique for power minimization during test application in sequential cir...
[[abstract]]This paper proposes a novel method to reduce the peak power of multiple scan chain based...
Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-...