[[abstract]]In this article, we apply the simulated annealing algorithm to determine optimally spaced inspection times for the two-parameter Weibull distribution for any given progressive Type-I grouped censoring plan. We examine how the asymptotic relative efficiencies of the estimates are affected by the position of the monitoring points and the number of monitoring points used. A comparison of different inspection plans is made that will enable the user to select a plan for a specified quality goal. Using the same algorithm, we can also determine an optimal progressive Type-I grouped censoring plan when the inspection times and the expected proportions of total failures in the experiment are pre-fixed. Finally, we discuss the sample size...
This paper presents reliability sampling plans for the Weibull distribution under Type II progressiv...
[[abstract]]This paper gives a reliability sampling plan for progressively type I interval censored ...
Accelerated life testing of manufactured units is performed in order to speed up testing through eit...
[[abstract]]In this paper, we determine optimally spaced inspection times for the two-parameter logn...
[[abstract]]This paper considers a life test under progressive type I group censoring with a Weibull...
This paper considers a life test under progressive type I group censoring with a Weibull failure tim...
[[abstract]]This article discusses a life test under progressive type-I group-censoring. We use maxi...
In this study, the experimental design is developed based on the testing procedure for the lifetime ...
[[abstract]]In this paper, a new life test plan called a progressive first-failure-censoring scheme ...
[[abstract]]Based on progressive type-II censored sample with random removals, point and interval es...
When a life test is terminated at a predetermined time to decide whether to accept or refuse the sub...
[[abstract]]In this article, reliability sampling plans are developed for the Weibull distribution w...
Optimization algorithms provides efficient solutions to many statistical problems. Essentially, the ...
[[abstract]]In this article, we investigate some reliability and quality problems when the competing...
[[abstract]]When the distribution of lifetimes is 2-parameter exponential, Balasooriya (1995) provid...
This paper presents reliability sampling plans for the Weibull distribution under Type II progressiv...
[[abstract]]This paper gives a reliability sampling plan for progressively type I interval censored ...
Accelerated life testing of manufactured units is performed in order to speed up testing through eit...
[[abstract]]In this paper, we determine optimally spaced inspection times for the two-parameter logn...
[[abstract]]This paper considers a life test under progressive type I group censoring with a Weibull...
This paper considers a life test under progressive type I group censoring with a Weibull failure tim...
[[abstract]]This article discusses a life test under progressive type-I group-censoring. We use maxi...
In this study, the experimental design is developed based on the testing procedure for the lifetime ...
[[abstract]]In this paper, a new life test plan called a progressive first-failure-censoring scheme ...
[[abstract]]Based on progressive type-II censored sample with random removals, point and interval es...
When a life test is terminated at a predetermined time to decide whether to accept or refuse the sub...
[[abstract]]In this article, reliability sampling plans are developed for the Weibull distribution w...
Optimization algorithms provides efficient solutions to many statistical problems. Essentially, the ...
[[abstract]]In this article, we investigate some reliability and quality problems when the competing...
[[abstract]]When the distribution of lifetimes is 2-parameter exponential, Balasooriya (1995) provid...
This paper presents reliability sampling plans for the Weibull distribution under Type II progressiv...
[[abstract]]This paper gives a reliability sampling plan for progressively type I interval censored ...
Accelerated life testing of manufactured units is performed in order to speed up testing through eit...