[[abstract]]With today's high technology, many products last so long that life testing at usual conditions is impractical. Many products can be life tested at high stress conditions to yield failures quickly. This study presents the inferences of parameters on the stepstress model in accelerated life testing with type II censoring. A two-parameter exponential failure time distribution with a hazard function that is a log-linear function of stress and a cumulative exposure model are considered. We obtain the maximum likelihood estimators of the model parameters and construct their confidence region. A numerical example will be investigated to illustrate the proposed inferential procedure.[[notice]]補正完畢[[journaltype]]國外[[ispeerreviewed]]Y[[bo...
[[abstract]]We consider a k-step step-stress model under Type-I censoring. We obtain the maximum lik...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
In order to gather the information about the lifetime distribution of a product, a standard life tes...
In reliability and life-testing experiments, the researcher is often interested in the effects of ex...
In life testing, the lifetimes of test units under the usual conditions are so long that life testin...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
The step-stress accelerated life tests allow the experimenter to increase the stress levels at fixed...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this article, we present the parameter inference in step-stress accelerated life tests under the ...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
The present paper explores estimating failure time data under step-stress partially accelerated life...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
[[abstract]]We consider a k-step step-stress model under Type-I censoring. We obtain the maximum lik...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
In order to gather the information about the lifetime distribution of a product, a standard life tes...
In reliability and life-testing experiments, the researcher is often interested in the effects of ex...
In life testing, the lifetimes of test units under the usual conditions are so long that life testin...
In this paper, the topic of step-stress partially accelerated life tests with progressive Type-II ce...
The step-stress accelerated life tests allow the experimenter to increase the stress levels at fixed...
[[abstract]]Accelerated life testing of products is used to get information quickly on their lifetim...
In this article, we present the parameter inference in step-stress accelerated life tests under the ...
This paper discusses step-stress partially accelerated life test under progressive type-II censoring...
Abstract. This paper discusses step-stress partially accelerated life test under progressive type-II...
[[abstract]]Some traditional life tests result in no or very few failures by the end of test. In suc...
Based on progressive first-failure censoring, step-stress partially accelerated life tests are consi...
The present paper explores estimating failure time data under step-stress partially accelerated life...
Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3[[abstract]]We consider in this work a k-lev...
[[abstract]]We consider a k-step step-stress model under Type-I censoring. We obtain the maximum lik...
We consider an optimization design for the alpha power exponential (APE) distribution as asymmetrica...
In order to gather the information about the lifetime distribution of a product, a standard life tes...