We experimentally demonstrate that metal/oxide/floating-Schottky junction has multiple effective capacitances depending on the amount of electrons stored in the floating metal electrode. The oxide thin film covering the Schottky junction is used to trap electrons in the floating metal. The electron flow into and out of the floating metal is controlled by applying voltage pulses of opposite polarities onto the semiconductor substrate. With the amount of excess charges in the floating metal, the depletion capacitance of Schottky junction varies synchronously, which dominantly affects the effective capacitance of the whole junction. Interestingly, the capacitance of metal/oxide/floating-Schottky junction measured as a function of applied volta...
To form crystalline Si dots embedded in SiO2, we have deposited thin films of silicon-rich oxide (SR...
In this work, charge trapping in silicon nanocrystals (nc-Si) distributed throughout the gate oxide ...
International audienceThe metal-oxide-semiconductor (MOS) capacitor is one of the fundamental electr...
A memory computing (memcomputing) system can store and process information at the same physical loca...
A non-volatile nanociystal floating gate MOS capacitor with multi-level function is achieved by engi...
Nonvolatile and reversible capacitance changes are demonstrated in a floating-gate metal-oxide-semic...
In this paper, we report a study on time-domain capacitance characterization of metal-oxide-semicond...
This document begins with a brief review of the concept and properties of memory circuit elements, n...
Thesis (M. Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering an...
This work reports the fabrication and characterization of metal-insulator-metal (MIM) structures bas...
Underlying mechanism of metal-oxide-metal resistive switching device has been of long research inter...
The induced changes of the flatband voltage by the location of holes in a silicon-rich oxide (SRO) f...
This work exploits the coexistence of both resistance and capacitance memory effects in TiO2-based t...
In this work, we performed a study of capacitance-voltage (C-V) hysteresis in HfO2 /InGaAs metal-oxi...
International audienceA discussion of the methodological possibilities for studying the capacitance-...
To form crystalline Si dots embedded in SiO2, we have deposited thin films of silicon-rich oxide (SR...
In this work, charge trapping in silicon nanocrystals (nc-Si) distributed throughout the gate oxide ...
International audienceThe metal-oxide-semiconductor (MOS) capacitor is one of the fundamental electr...
A memory computing (memcomputing) system can store and process information at the same physical loca...
A non-volatile nanociystal floating gate MOS capacitor with multi-level function is achieved by engi...
Nonvolatile and reversible capacitance changes are demonstrated in a floating-gate metal-oxide-semic...
In this paper, we report a study on time-domain capacitance characterization of metal-oxide-semicond...
This document begins with a brief review of the concept and properties of memory circuit elements, n...
Thesis (M. Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering an...
This work reports the fabrication and characterization of metal-insulator-metal (MIM) structures bas...
Underlying mechanism of metal-oxide-metal resistive switching device has been of long research inter...
The induced changes of the flatband voltage by the location of holes in a silicon-rich oxide (SRO) f...
This work exploits the coexistence of both resistance and capacitance memory effects in TiO2-based t...
In this work, we performed a study of capacitance-voltage (C-V) hysteresis in HfO2 /InGaAs metal-oxi...
International audienceA discussion of the methodological possibilities for studying the capacitance-...
To form crystalline Si dots embedded in SiO2, we have deposited thin films of silicon-rich oxide (SR...
In this work, charge trapping in silicon nanocrystals (nc-Si) distributed throughout the gate oxide ...
International audienceThe metal-oxide-semiconductor (MOS) capacitor is one of the fundamental electr...