Polarimetric performance of Si/CdTe semiconductor Compton camera
- Takeda, Shin'ichiro
- Odaka, Hirokazu
- Katsuta, Junichiro
- Ishikawa, Shin-nosuke
- Sugimoto, So-ichiro
- Koseki, Yuu
- Watanabe, Shin
- Sato, Goro
- Kokubun, Motohide
- Takahashi, Tadayuki
- Nakazawa, Kazuhiro
- Fukazawa, Yasushi
- Tajima, Hiroyasu
- Toyokawa, Hidenori
Publication date
October 2010
DOI Publisher
Elsevier BV Journal
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated EquipmentAbstract
A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and gamma-ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized gamma-rays at SPring-8
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