Highly transparent and luminescent nanostructured Eu203 doped ZnO films.

Zinc oxide is a wide, direct band gap II-VI oxide semiconductor. Pure and Eu-doped ZnO films are prepared by RF Magnetron sputtering at different doping concentrations (0.5, 1, 3 and 5 wt %). The films are annealed at 500 0C in air for two hours. The structural, morphological and optical properties of the films are characterized using XRD, micro-Raman, AFM, UV-Visible and photoluminescence spectroscopy. The thickness of the films is measured using stylus profilometer. XRD analysis shows that all the films are highly c-axis oriented exhibiting a single peak corresponding to (002) lattice reflection plane of hexagonal wurtzite crystal phase of ZnO. The micro-Raman spectra analysis reveals the presence of E2 high mode in all the samples which is the intrinsic characteristic of hexagonal wurtzite structure of ZnO. The appearance of LO modes indicates the formation of defects such as oxygen vacancies in the films. AFM micrographs show uniform distribution of densely packed grains of size with well defined grain boundaries. All the films exhibit very high transmittance (above 80%) in the visible region with a sharp fundamental absorption edge around 380 nm corresponding to the intrinsic band edge of ZnO. All the films show PL emission in the UV and visible region. Paper presented at the 2nd International Conference on Structural Nano Composites (NANOSTRUC 2014) held 20-21 May 2014 in Madrid, Spain