IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2017 : Cambridge, ENGLAND)Bit flips on instructions may affect the execution of the processor depending on the Instruction Set Architecture (ISA) and the location of the flipped bits. Intrinsically, ISAs may detect bit upsets if the errors on the instructions produce exceptions that halt the execution. Previous works exploit this fact to improve the error detection capabilities of ISAs with an addition of simple encoding/decoding scheme to propagate any single bit error to the "most vulnerable bit" of the instructions in order to detect the error by crashing the system. Although it was proven that this approach significantly reduces the Sile...
Due to the continuously decreasing feature sizes and the increasing complexity of integrated circuit...
The fundamental structure of BFs has additionally been extended through the years. For instance, cou...
This paper presents the results of an extensive experimental study of bit-flip errors in instruction...
Bit flips on instructions may affect the execution of the processor depending on the Instruction Set...
Bloom filters are used in many computing and networking applications where they provide a simple met...
This paper presents the results of an extensive fault injection study of the impact of processor fau...
Increasing design complexity for current and future generations of microelectronic technologies lead...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets lead to d...
Fault injection attacks are a threat to all digital systems, especially to the ones conducting secur...
Recent increase of transient fault rates has made processor reliability a major concern. Moreover pe...
Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a s...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
We present an experimental study in which we investigate the impact of particle induced soft errors ...
Due to the continuously decreasing feature sizes and the increasing complexity of integrated circuit...
The fundamental structure of BFs has additionally been extended through the years. For instance, cou...
This paper presents the results of an extensive experimental study of bit-flip errors in instruction...
Bit flips on instructions may affect the execution of the processor depending on the Instruction Set...
Bloom filters are used in many computing and networking applications where they provide a simple met...
This paper presents the results of an extensive fault injection study of the impact of processor fau...
Increasing design complexity for current and future generations of microelectronic technologies lead...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets lead to d...
Fault injection attacks are a threat to all digital systems, especially to the ones conducting secur...
Recent increase of transient fault rates has made processor reliability a major concern. Moreover pe...
Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a s...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
We present an experimental study in which we investigate the impact of particle induced soft errors ...
Due to the continuously decreasing feature sizes and the increasing complexity of integrated circuit...
The fundamental structure of BFs has additionally been extended through the years. For instance, cou...
This paper presents the results of an extensive experimental study of bit-flip errors in instruction...