The Josephson junction is the most important basic device in active superconductor electronics. Ramp-type junctions are used in high-temperature-superconductor (HTS) devices because the fabrication process of these junctions is compatible with a complex multilayer technology and provides a high design flexibility. Most EFTS-applications require a high normal resistance of the junctions. Therefore PrBa$_{2}$Cu$_{3}$O$_{7-\delta}$ (PBCO) can be used as the barrier material with a high resistivity. In this work, the charge transport at the interfaces of the barrier to the superconducting electrodes was investigated. To compare the influence of the degradation during the ion-beam milling process of the ramp, a second fabrication process was use...
A thin interlayer is incorporated in ramp-type Josephson junctions to obtain an increased transparen...
High-Tc Josephson junctions with a graded barrier have been prepared by using a composite target. Su...
We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Jo...
The Josephson junction is the most important basic device in active superconductor electronics. Ramp...
Josephson junctions are the most important active elements in high-temperaturesuperconductor (FITS) ...
Josephson junctions are the most important active elements in high-temperature-superconductor (HTS) ...
The Josephson junction is the key active device in the superconductor electronics. Junctions in the ...
A study of the YBCO/PBCO/YBCO ramp junctions with and without PBCO barrier shows that the Josephson ...
Ramp type Josephson junctions have been fabricated using DyBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// as...
The transport properties of "interface-engineered" edge-type YBa2Cu3O7 Josephson junctions are inves...
The mechanisms of current passage and the causes of IcRn (critical-current normal-resistance) produc...
We have investigated both experimentally and theoretically the normal state resistance and Josephson...
We report preparation of a novel barrier structure for high Tc superconducting multilayer Josephson ...
In this contribution we will discuss the charge transport of ramp-type HTS Josephson junctions with ...
In this contribution we will discuss the requirements to be imposed on the barriers of HTS Josephson...
A thin interlayer is incorporated in ramp-type Josephson junctions to obtain an increased transparen...
High-Tc Josephson junctions with a graded barrier have been prepared by using a composite target. Su...
We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Jo...
The Josephson junction is the most important basic device in active superconductor electronics. Ramp...
Josephson junctions are the most important active elements in high-temperaturesuperconductor (FITS) ...
Josephson junctions are the most important active elements in high-temperature-superconductor (HTS) ...
The Josephson junction is the key active device in the superconductor electronics. Junctions in the ...
A study of the YBCO/PBCO/YBCO ramp junctions with and without PBCO barrier shows that the Josephson ...
Ramp type Josephson junctions have been fabricated using DyBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// as...
The transport properties of "interface-engineered" edge-type YBa2Cu3O7 Josephson junctions are inves...
The mechanisms of current passage and the causes of IcRn (critical-current normal-resistance) produc...
We have investigated both experimentally and theoretically the normal state resistance and Josephson...
We report preparation of a novel barrier structure for high Tc superconducting multilayer Josephson ...
In this contribution we will discuss the charge transport of ramp-type HTS Josephson junctions with ...
In this contribution we will discuss the requirements to be imposed on the barriers of HTS Josephson...
A thin interlayer is incorporated in ramp-type Josephson junctions to obtain an increased transparen...
High-Tc Josephson junctions with a graded barrier have been prepared by using a composite target. Su...
We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Jo...