The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test access port (TAP) as the interface between the boundary of integrated circuits (ICs) and IEEE Std. 1687 networks. In this paper, we investigate the use of universal asynchronous receiver-transmitter (UART) to access IEEE Std. 1687 networks. We have developed a protocol to describe the information transported over UART and a hardware component to translate (retarget) information between UART and IEEE Std. 1687. The objective is to minimize the amount of information transported over UART and the area of the hardware component while maintaining the flexibility to access an arbitrary combination of instrument in the IEEE Std. 1687 network. We have d...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
A UART (Universal Asynchronous Receiver Transmitter) is typically a piece of hardware on microcontro...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
In systems involving multiple peripherals with diverse bus protocols it is desirable to have a versa...
International audienceThe industry is moving forward with non-TAP, chip-level interfaces driving IEE...
The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when us...
International audienceThe IEEE 1687 standard enabled the possibility of “alternate access methods” b...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
A UART (Universal Asynchronous Receiver Transmitter) is typically a piece of hardware on microcontro...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
In systems involving multiple peripherals with diverse bus protocols it is desirable to have a versa...
International audienceThe industry is moving forward with non-TAP, chip-level interfaces driving IEE...
The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when us...
International audienceThe IEEE 1687 standard enabled the possibility of “alternate access methods” b...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
A UART (Universal Asynchronous Receiver Transmitter) is typically a piece of hardware on microcontro...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...