In situ X-ray examination at a synchrotron beamline of the solution growth of self-assembled SiGe structures on silicon (001) substrates through the backside has been realized by a specific heating equipment and a suitable growth assembly. The furnace allows heating of the growth assembly up to 600 degrees C. The temperature field and the gas flow in the furnace have been numerically modeled. In this way a meaningful estimate about the power consumption and the thermal gradient across the sample has been reached. Despite its low heat capacity and, thus, fast heating and cooling ability the furnace can be stabilized to +/- 0.1 K by a high-performance temperature controller. The growth assembly has been prepared within three separate stages c...
Germanium films have been grown on Ge wafer, GaAs wafer and flexible substrate by liquid phase epita...
The investigation objects are the monocrystalline epitaxial silicon films alloyed by a gallium. The ...
We discuss the effect of the deposition of a Si cap layer on the composition and morphological prope...
Low temperature steady-state solution growth of silicon from indium on Si(001) substrates with a ver...
In this work self-organized SiGe islands are used as stressors for Si capping layers, which later ac...
The goal of this study is to obtain fundamental process-property relationships for the SiGe epitaxia...
Atmospheric pressure chemical v por deposition (APCVD) has been used to grow an epitaxial SiGe-base ...
Coherent Si1-xGexisland growth by molecular beam epitaxy is studied for a fixed growth temperature b...
We report on studies of strain and composition of two-dimensionally ordered SiGe islands grown by mo...
OVERVIEW: The increasing sophistication of home electronics and telecommunication devices is propell...
Over the past several years, advances in the SiGe technologies have shown impressive potential for f...
Using reflection-high-energy-electron-diffraction intensity oscillations the growth rate of Si1-xGex...
The low temperature epitaxy of Si and SiGe has been investigated with a disilane-based precursor. Th...
Low temperature (similar to 500 degrees C) growth properties of Si1-xGex by disilane and solid-Ge mo...
We have studied the initial stages of strained SiGe alloy growth on the Si(001)(.)(2 X 1) surface by...
Germanium films have been grown on Ge wafer, GaAs wafer and flexible substrate by liquid phase epita...
The investigation objects are the monocrystalline epitaxial silicon films alloyed by a gallium. The ...
We discuss the effect of the deposition of a Si cap layer on the composition and morphological prope...
Low temperature steady-state solution growth of silicon from indium on Si(001) substrates with a ver...
In this work self-organized SiGe islands are used as stressors for Si capping layers, which later ac...
The goal of this study is to obtain fundamental process-property relationships for the SiGe epitaxia...
Atmospheric pressure chemical v por deposition (APCVD) has been used to grow an epitaxial SiGe-base ...
Coherent Si1-xGexisland growth by molecular beam epitaxy is studied for a fixed growth temperature b...
We report on studies of strain and composition of two-dimensionally ordered SiGe islands grown by mo...
OVERVIEW: The increasing sophistication of home electronics and telecommunication devices is propell...
Over the past several years, advances in the SiGe technologies have shown impressive potential for f...
Using reflection-high-energy-electron-diffraction intensity oscillations the growth rate of Si1-xGex...
The low temperature epitaxy of Si and SiGe has been investigated with a disilane-based precursor. Th...
Low temperature (similar to 500 degrees C) growth properties of Si1-xGex by disilane and solid-Ge mo...
We have studied the initial stages of strained SiGe alloy growth on the Si(001)(.)(2 X 1) surface by...
Germanium films have been grown on Ge wafer, GaAs wafer and flexible substrate by liquid phase epita...
The investigation objects are the monocrystalline epitaxial silicon films alloyed by a gallium. The ...
We discuss the effect of the deposition of a Si cap layer on the composition and morphological prope...