The quality of a CdZnTe-based X-ray detector is highly related to the interface between semiconductor and metal contact. One of the factors that increase leakage currents in CdZnTe based X-Ray detectors is the presence of a conductive surface layer. In this paper the result of the passivation of the CdZnTe surface by means of an aqueous etching solution of NH4F/H2O2 is studied by optical ellipsometry and by the current-voltage characteristics of gold contacts deposited on the etched surface. Collected data show that leakage currents can be reduced and contact stability improved by the combined use of the passivation layer and a guard ring
Dark currents, including those in the surface and bulk, are the leading source of electronic noise i...
The performance of single crystal CdZnTe radiation detectors is dependent on both the bulk and the s...
The chemical nature of CdTe and ZnSe surfaces prepared by various chemical treatments has been studi...
The quality of a CdZnTe-based X-ray detector is highly related to the interface between semiconducto...
Semiconductor materials have a vast range of applications varying from basic electronic products to ...
In the present work we studied an influence of different types of surface etching and surface passiv...
Spectroscopic X-ray imaging is an emerging technology with applications in the fields of medical ima...
Cadmium zinc telluride (CdZnTe) is a leading sensor material for spectroscopic X/-ray imaging in the...
Fully spectroscopic x/γ-ray imaging is now possible thanks to advances in the growth of wide-bandga...
Surface processing plays a major role in manufacturing CdZnTe semiconductor devices used for radiati...
Performance of CdZnTe-based detectors is highly related to the surface quality. Mechanical polishing...
Surface passivation of device-grade radiation detector materials was investigated using x-ray photoe...
Several cadmium zinc telluride (CZT) crystals were fabricated into radiation detectors using methods...
In this thesis, the influence of metal contacts, prepared on CdZnTe-based semiconductor material by ...
Cadmium zinc telluride (CdZnTe) is now established as a popular choice of sensor for the detection o...
Dark currents, including those in the surface and bulk, are the leading source of electronic noise i...
The performance of single crystal CdZnTe radiation detectors is dependent on both the bulk and the s...
The chemical nature of CdTe and ZnSe surfaces prepared by various chemical treatments has been studi...
The quality of a CdZnTe-based X-ray detector is highly related to the interface between semiconducto...
Semiconductor materials have a vast range of applications varying from basic electronic products to ...
In the present work we studied an influence of different types of surface etching and surface passiv...
Spectroscopic X-ray imaging is an emerging technology with applications in the fields of medical ima...
Cadmium zinc telluride (CdZnTe) is a leading sensor material for spectroscopic X/-ray imaging in the...
Fully spectroscopic x/γ-ray imaging is now possible thanks to advances in the growth of wide-bandga...
Surface processing plays a major role in manufacturing CdZnTe semiconductor devices used for radiati...
Performance of CdZnTe-based detectors is highly related to the surface quality. Mechanical polishing...
Surface passivation of device-grade radiation detector materials was investigated using x-ray photoe...
Several cadmium zinc telluride (CZT) crystals were fabricated into radiation detectors using methods...
In this thesis, the influence of metal contacts, prepared on CdZnTe-based semiconductor material by ...
Cadmium zinc telluride (CdZnTe) is now established as a popular choice of sensor for the detection o...
Dark currents, including those in the surface and bulk, are the leading source of electronic noise i...
The performance of single crystal CdZnTe radiation detectors is dependent on both the bulk and the s...
The chemical nature of CdTe and ZnSe surfaces prepared by various chemical treatments has been studi...