MeV energy N +-Implanted planar optical waveguides in Er-doped tungsten-tellurite glass operating at 1.55 μm
- Banyasz I.
- Berneschi S.
- Brenci M.
- Fried M.
- Khanh N. Q.
- Lohner T.
- Conti G. N.
- Pelli S.
- Petrik P.
- Righini G. C.
- Watterich A.
- Zolnai Z.
- BETTINELLI, Marco Giovanni
- SPEGHINI, Adolfo
Publication date
January 2012
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
We report on the fabrication and characterization of planar waveguides in an Er-doped tungsten-tellurite glass by implantation of 3.5 MeV N + ions. Implantations were carried out in a wide fluence range of 1 · 10 16 8 · 10 16 ions/cm 2. Waveguides were characterized by m-line spectroscopy and spectroscopic ellipsometry. Irradiation-induced refractive index modulation saturated around a fluence of 8 · 10 16 ions/cm 2. Waveguides operating at 1550 nm were obtained in that material using 3.5 MeV N + ion implantation. © 2012 IEEE
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