Carbon Nanotube Interconnect Modeling for Very Large Scale Integrated Circuits

In this research, we have studied and analyzed the physical and electrical properties of carbon nanotubes. Based on the reported models for current transport behavior in non-ballistic CNT-FETs, we have built a dynamic model for non-ballistic CNT-FETs. We have also extended the surface potential model of a non-ballistic CNT-FET to a ballistic CNT-FET and developed a current transport model for ballistic CNT-FETs. We have studied the current transport in metallic carbon nanotubes. By considering the electron-electron interactions, we have modified two-dimensional fluid model for electron transport to build a semi-classical one-dimensional fluid model to describe the electron transport in carbon nanotubes, which is regarded as one-dimensional system. Besides its accuracy compared with two-dimensional fluid model and Lüttinger liquid theory, one-dimensional fluid model is simple in mathematical modeling and easier to extend for electronic transport modeling of multi-walled carbon nanotubes and single-walled carbon nanotube bundles as interconnections. Based on our reported one-dimensional fluid model, we have calculated the parameters of the transmission line model for the interconnection wires made of single-walled carbon nanotube, multi-walled carbon nanotube and single-walled carbon nanotube bundle. The parameters calculated from these models show close agreements with experiments and other proposed models. We have also implemented these models to study carbon nanotube for on-chip wire inductors and it application in design of LC voltage-controlled oscillators. By using these CNT-FET models and CNT interconnects models, we have studied the behavior of CNT based integrated circuits, such as the inverter, ring oscillator, energy recovery logic; and faults in CNT based circuits