X-Ray Backlighting for the National Ignition Facility

X-ray backlighting is a powerful tool for diagnosing a large variety of high-energy-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to NIF-scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point projection technique, pinhole and slit arrays, distributed polychromatic sources, and picket fence backlighters. In parallel, there have been developments in improving the data SNR and hence quality by switching from film to CCD-based recording media and by removing the fixed-pattern noise of MCP-based cameras