The refractive index and the thickness of a transparent pellicle are determined when the pellicle is placed between two vertical crossed polarizers and rotated in the horizontal plane. The transmission axes of the polarizers are neither parallel nor perpendicular to the plane of incidence. The light transmitted through the crossed polarizers reaches a minimum when the pellicle satisfies the absentee-layer condition. The refractive index and the film thickness are obtained from the pellicle orientation angles under such a condition
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for...
Measurements of the polarization states (represented by complex numbers Xr and Xt, respectively) of ...
At a given wavelength λ we determine all possible solution pairs (ϕ, ζ) of the incidence angle ϕ and...
The p- and s-polarized components of light can be suppressed on reflection at the same angle of inci...
A simple non-destructive method of measuring the refractive index and thickness of transparent films...
Explicit equations are derived that determine the refractive index of a single layer that suppresses...
The ratio ρt = Tp/Ts of the complex amplitude transmission coefficients for the p and s polarization...
Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-s...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for...
Measurements of the polarization states (represented by complex numbers Xr and Xt, respectively) of ...
At a given wavelength λ we determine all possible solution pairs (ϕ, ζ) of the incidence angle ϕ and...
The p- and s-polarized components of light can be suppressed on reflection at the same angle of inci...
A simple non-destructive method of measuring the refractive index and thickness of transparent films...
Explicit equations are derived that determine the refractive index of a single layer that suppresses...
The ratio ρt = Tp/Ts of the complex amplitude transmission coefficients for the p and s polarization...
Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-s...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for...